In this paper, a self-recoverable, frequency-aware and cost-effective robust latch (referred to as RFC) is proposed in 45nm CMOS technology. By means of triple mutually feedback Muller C-elements, the internal nodes and output node of the latch are self-recoverable from single event upset (SEU), i.e. particle striking induced logic upset, regardless of the energy of the striking particle. The proposed robust latch offers a much wider spectrum of working clock frequency on account of a smaller delay and insensitivity to high impedance state. The proposed robust latch performs with lower costs regarding power and area than most of the compared latches. SPICE simulation results demonstrate that the area-power-delay product is 73.74% saving on average compared with previous radiation hardened latches.

In this paper, we propose a fault-tolerance mechanism for microprocessors, which detects transient faults and recovers from them. The investigation of fault-tolerance techniques for microprocessors is driven by two issues: One regards deep submicron fabrication technologies. Future semiconductor technologies could become more susceptible to alpha particles and other cosmic radiation. The other is the increasing popularity of mobile platforms. Cellular telephones are currently used for applications which are critical to our financial security, such as mobile banking, mobile trading, and making airline ticket reservations. Such applications demand that computer systems work correctly. In light of this, we propose a mechanism which is based on an instruction reissue technique for incorrect data speculation recovery and utilizes time redundancy, and evaluate our proposal using a timing simulator.