One of the technological innovations that has enabled the VLSI semiconductor industry to reduce the transistor size, increase the number of transistors per die, and also follow Moore's law year after year is the fact that an equivalent yield and equivalent testing quality have been ensured for the same die size. This has contributed to reducing the economically optimum production cost (production cost per component) as advocated by Moore. In this paper, we will verify Moore's law using actual values from VLSI manufacturing sites while introducing some of the technical progress that occurred from 1970 to 2010.