Verification of Moore's Law Using Actual Semiconductor Production Data
Summary :
One of the technological innovations that has enabled the VLSI semiconductor industry to reduce the transistor size, increase the number of transistors per die, and also follow Moore's law year after year is the fact that an equivalent yield and equivalent testing quality have been ensured for the same die size. This has contributed to reducing the economically optimum production cost (production cost per component) as advocated by Moore. In this paper, we will verify Moore's law using actual values from VLSI manufacturing sites while introducing some of the technical progress that occurred from 1970 to 2010.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E97-C No.6 pp.599-608
- Publication Date
- 2014/06/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E97.C.599
- Type of Manuscript
- PAPER
- Category
- Semiconductor Materials and Devices
Authors
Keyword
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Junichi HIRASE, "Verification of Moore's Law Using Actual Semiconductor Production Data" in IEICE TRANSACTIONS on Electronics,
vol. E97-C, no. 6, pp. 599-608, June 2014, doi: 10.1587/transele.E97.C.599.
Abstract: One of the technological innovations that has enabled the VLSI semiconductor industry to reduce the transistor size, increase the number of transistors per die, and also follow Moore's law year after year is the fact that an equivalent yield and equivalent testing quality have been ensured for the same die size. This has contributed to reducing the economically optimum production cost (production cost per component) as advocated by Moore. In this paper, we will verify Moore's law using actual values from VLSI manufacturing sites while introducing some of the technical progress that occurred from 1970 to 2010.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E97.C.599/_p
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@ARTICLE{e97-c_6_599,
author={Junichi HIRASE, },
journal={IEICE TRANSACTIONS on Electronics},
title={Verification of Moore's Law Using Actual Semiconductor Production Data},
year={2014},
volume={E97-C},
number={6},
pages={599-608},
abstract={One of the technological innovations that has enabled the VLSI semiconductor industry to reduce the transistor size, increase the number of transistors per die, and also follow Moore's law year after year is the fact that an equivalent yield and equivalent testing quality have been ensured for the same die size. This has contributed to reducing the economically optimum production cost (production cost per component) as advocated by Moore. In this paper, we will verify Moore's law using actual values from VLSI manufacturing sites while introducing some of the technical progress that occurred from 1970 to 2010.},
keywords={},
doi={10.1587/transele.E97.C.599},
ISSN={1745-1353},
month={June},}
Copy
TY - JOUR
TI - Verification of Moore's Law Using Actual Semiconductor Production Data
T2 - IEICE TRANSACTIONS on Electronics
SP - 599
EP - 608
AU - Junichi HIRASE
PY - 2014
DO - 10.1587/transele.E97.C.599
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E97-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2014
AB - One of the technological innovations that has enabled the VLSI semiconductor industry to reduce the transistor size, increase the number of transistors per die, and also follow Moore's law year after year is the fact that an equivalent yield and equivalent testing quality have been ensured for the same die size. This has contributed to reducing the economically optimum production cost (production cost per component) as advocated by Moore. In this paper, we will verify Moore's law using actual values from VLSI manufacturing sites while introducing some of the technical progress that occurred from 1970 to 2010.
ER -
English
