In this paper, we describe a worst-case design optimization approach for statistical design of integrated circuits with a circuit performance model scheme. After formulating worst-case optimization to an unconstrained multi-objective function minimization problem, a new objective function is proposed to find an optimal point. Then, based on an interpolation model scheme of approximating circuit performance, realistic worst-case analysis can be easily done by Monte Carlo based method without increasing much the computational load. The effectiveness of the presented approach is demonstrated by a standard test function and a practical circuit design example.