Electric contact is one of the most important noise sources of electromagnetic noise. Hence, the noise of contact switching has been researched from various points of view with respect to the generation mechanism and properties. However, many phenomena have been remained not being investigated yet. In this paper, we describe our recent investigations about characteristics of the induced noise that is produced by the break of silver contact. The number of TTL IC's malfunction in the relay switching are counted under conditions of inductive load (10mH), circuit current (0.1-2A), and low source voltage (24V). From this experimental results, it became clear that the rate of malfunction decreased with increasing circuit current. To clarify its phenomenon, the circuit current dependence of the induced noise voltage was measured. It was observed that the level of induced noise voltage became the maximum in the current range of 0.2-1A. This property is discussed by the occurrence mechanism of each discharge mode on the break of contacts and the observation of induced noise corresponding to its mode.
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Keiichi UCHIMURA, Hiroshi FUJITA, "Induced Noise Properties Caused by Circuit Interruption with Electric Contacts" in IEICE TRANSACTIONS on Communications,
vol. E74-B, no. 7, pp. 1935-1940, July 1991, doi: .
Abstract: Electric contact is one of the most important noise sources of electromagnetic noise. Hence, the noise of contact switching has been researched from various points of view with respect to the generation mechanism and properties. However, many phenomena have been remained not being investigated yet. In this paper, we describe our recent investigations about characteristics of the induced noise that is produced by the break of silver contact. The number of TTL IC's malfunction in the relay switching are counted under conditions of inductive load (10mH), circuit current (0.1-2A), and low source voltage (24V). From this experimental results, it became clear that the rate of malfunction decreased with increasing circuit current. To clarify its phenomenon, the circuit current dependence of the induced noise voltage was measured. It was observed that the level of induced noise voltage became the maximum in the current range of 0.2-1A. This property is discussed by the occurrence mechanism of each discharge mode on the break of contacts and the observation of induced noise corresponding to its mode.
URL: https://global.ieice.org/en_transactions/communications/10.1587/e74-b_7_1935/_p
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@ARTICLE{e74-b_7_1935,
author={Keiichi UCHIMURA, Hiroshi FUJITA, },
journal={IEICE TRANSACTIONS on Communications},
title={Induced Noise Properties Caused by Circuit Interruption with Electric Contacts},
year={1991},
volume={E74-B},
number={7},
pages={1935-1940},
abstract={Electric contact is one of the most important noise sources of electromagnetic noise. Hence, the noise of contact switching has been researched from various points of view with respect to the generation mechanism and properties. However, many phenomena have been remained not being investigated yet. In this paper, we describe our recent investigations about characteristics of the induced noise that is produced by the break of silver contact. The number of TTL IC's malfunction in the relay switching are counted under conditions of inductive load (10mH), circuit current (0.1-2A), and low source voltage (24V). From this experimental results, it became clear that the rate of malfunction decreased with increasing circuit current. To clarify its phenomenon, the circuit current dependence of the induced noise voltage was measured. It was observed that the level of induced noise voltage became the maximum in the current range of 0.2-1A. This property is discussed by the occurrence mechanism of each discharge mode on the break of contacts and the observation of induced noise corresponding to its mode.},
keywords={},
doi={},
ISSN={},
month={July},}
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TY - JOUR
TI - Induced Noise Properties Caused by Circuit Interruption with Electric Contacts
T2 - IEICE TRANSACTIONS on Communications
SP - 1935
EP - 1940
AU - Keiichi UCHIMURA
AU - Hiroshi FUJITA
PY - 1991
DO -
JO - IEICE TRANSACTIONS on Communications
SN -
VL - E74-B
IS - 7
JA - IEICE TRANSACTIONS on Communications
Y1 - July 1991
AB - Electric contact is one of the most important noise sources of electromagnetic noise. Hence, the noise of contact switching has been researched from various points of view with respect to the generation mechanism and properties. However, many phenomena have been remained not being investigated yet. In this paper, we describe our recent investigations about characteristics of the induced noise that is produced by the break of silver contact. The number of TTL IC's malfunction in the relay switching are counted under conditions of inductive load (10mH), circuit current (0.1-2A), and low source voltage (24V). From this experimental results, it became clear that the rate of malfunction decreased with increasing circuit current. To clarify its phenomenon, the circuit current dependence of the induced noise voltage was measured. It was observed that the level of induced noise voltage became the maximum in the current range of 0.2-1A. This property is discussed by the occurrence mechanism of each discharge mode on the break of contacts and the observation of induced noise corresponding to its mode.
ER -