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Experimental Investigation of Noise Immunity Diagnosis for Battery Drived Circuit by Bulk Current Injection Test

Kohji SASABE, Kazuhisa YOSHIDA, Osamu FUJIWARA

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Summary :

A simple method for diagnosing noise immunity of printed circuit boards (PCBs) by the bulk current injection (BCI) test was proposed, which can contribute to the PCB trace designs for common-mode noise. A grading index, which is defined as the ratio of the stray capacitances with and without critical IC of malfunction, was introduced to distinguish the PCB susceptible to the common-mode noise. This proposed method was validated experimentally using four PCBs with the same circuit but different trace design. It was observed that the noise immunity of PCBs had a good correlation with the values of these grading indices.

Publication
IEICE TRANSACTIONS on Communications Vol.E83-B No.3 pp.618-621
Publication Date
2000/03/25
Publicized
Online ISSN
DOI
Type of Manuscript
Special Section LETTER (Special Issue on Recent Progress in Electromagnetic Compatibility Technology)
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