Response of Microwave on Bare Soil Moisture and Surface Roughness by X-Band Scatterometer

Dharmendra SINGH; Yoshio YAMAGUCHI; Hiroyoshi YAMADA; Keshev Prasad SINGH

Response of Microwave on Bare Soil Moisture and Surface Roughness by X-Band Scatterometer

Dharmendra SINGH, Yoshio YAMAGUCHI, Hiroyoshi YAMADA, Keshev Prasad SINGH

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This paper describes an individual effect of soil moisture (m_g) and surface roughness (h_rms) of bare soil on the back scattering coefficient (σ⁰) at the X-band frequency. The study contributes to the design of an efficient microwave sensor. For this purpose, experimentally observed data was utilized to provide a composite σ⁰ equation model accounting for individual effect in regression analysis. The experimental data are compared with Small Perturbation Method. It is observed that the X-band gives better agreement up to incidence angle 50 for HH-polarization and 60 for VV-polarization as compared to the C-band. The lower angles of incidence give better results than the higher angles for observing m_g at the X-band. The multiple and partial regression analyses have also carried out for predicting the dependence of scattering coefficient (σ⁰) on m_g and h_rms more accurately. The analyses suggest that the dependence of dielectric constant (i.e., m_g) is much more significant in comparison to surface roughness at lower angles of incidence for both like polarizations. The results propose the suitable angle of incidence for observing bare surface roughness and soil moisture at the X-band. All these data can be used as a reference for satellite or spaceborne sensors.

Publication: IEICE TRANSACTIONS on Communications Vol.E83-B No.9 pp.2038-2043

Publication Date: 2000/09/25

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Type of Manuscript: Special Section PAPER (Special Issue on Advances in Radar Systems)

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Dharmendra SINGH, Yoshio YAMAGUCHI, Hiroyoshi YAMADA, Keshev Prasad SINGH, "Response of Microwave on Bare Soil Moisture and Surface Roughness by X-Band Scatterometer" in IEICE TRANSACTIONS on Communications, vol. E83-B, no. 9, pp. 2038-2043, September 2000, doi: .
Abstract: This paper describes an individual effect of soil moisture (m_g) and surface roughness (h_rms) of bare soil on the back scattering coefficient (σ⁰) at the X-band frequency. The study contributes to the design of an efficient microwave sensor. For this purpose, experimentally observed data was utilized to provide a composite σ⁰ equation model accounting for individual effect in regression analysis. The experimental data are compared with Small Perturbation Method. It is observed that the X-band gives better agreement up to incidence angle 50 for HH-polarization and 60 for VV-polarization as compared to the C-band. The lower angles of incidence give better results than the higher angles for observing m_g at the X-band. The multiple and partial regression analyses have also carried out for predicting the dependence of scattering coefficient (σ⁰) on m_g and h_rms more accurately. The analyses suggest that the dependence of dielectric constant (i.e., m_g) is much more significant in comparison to surface roughness at lower angles of incidence for both like polarizations. The results propose the suitable angle of incidence for observing bare surface roughness and soil moisture at the X-band. All these data can be used as a reference for satellite or spaceborne sensors.
URL: https://global.ieice.org/en_transactions/communications/10.1587/e83-b_9_2038/_p

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@ARTICLE{e83-b_9_2038,
author={Dharmendra SINGH, Yoshio YAMAGUCHI, Hiroyoshi YAMADA, Keshev Prasad SINGH, },
journal={IEICE TRANSACTIONS on Communications},
title={Response of Microwave on Bare Soil Moisture and Surface Roughness by X-Band Scatterometer},
year={2000},
volume={E83-B},
number={9},
pages={2038-2043},
abstract={This paper describes an individual effect of soil moisture (m_g) and surface roughness (h_rms) of bare soil on the back scattering coefficient (σ⁰) at the X-band frequency. The study contributes to the design of an efficient microwave sensor. For this purpose, experimentally observed data was utilized to provide a composite σ⁰ equation model accounting for individual effect in regression analysis. The experimental data are compared with Small Perturbation Method. It is observed that the X-band gives better agreement up to incidence angle 50 for HH-polarization and 60 for VV-polarization as compared to the C-band. The lower angles of incidence give better results than the higher angles for observing m_g at the X-band. The multiple and partial regression analyses have also carried out for predicting the dependence of scattering coefficient (σ⁰) on m_g and h_rms more accurately. The analyses suggest that the dependence of dielectric constant (i.e., m_g) is much more significant in comparison to surface roughness at lower angles of incidence for both like polarizations. The results propose the suitable angle of incidence for observing bare surface roughness and soil moisture at the X-band. All these data can be used as a reference for satellite or spaceborne sensors.},
keywords={},
doi={},
ISSN={},
month={September},}

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TY - JOUR
TI - Response of Microwave on Bare Soil Moisture and Surface Roughness by X-Band Scatterometer
T2 - IEICE TRANSACTIONS on Communications
SP - 2038
EP - 2043
AU - Dharmendra SINGH
AU - Yoshio YAMAGUCHI
AU - Hiroyoshi YAMADA
AU - Keshev Prasad SINGH
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Communications
SN -
VL - E83-B
IS - 9
JA - IEICE TRANSACTIONS on Communications
Y1 - September 2000
AB - This paper describes an individual effect of soil moisture (m_g) and surface roughness (h_rms) of bare soil on the back scattering coefficient (σ⁰) at the X-band frequency. The study contributes to the design of an efficient microwave sensor. For this purpose, experimentally observed data was utilized to provide a composite σ⁰ equation model accounting for individual effect in regression analysis. The experimental data are compared with Small Perturbation Method. It is observed that the X-band gives better agreement up to incidence angle 50 for HH-polarization and 60 for VV-polarization as compared to the C-band. The lower angles of incidence give better results than the higher angles for observing m_g at the X-band. The multiple and partial regression analyses have also carried out for predicting the dependence of scattering coefficient (σ⁰) on m_g and h_rms more accurately. The analyses suggest that the dependence of dielectric constant (i.e., m_g) is much more significant in comparison to surface roughness at lower angles of incidence for both like polarizations. The results propose the suitable angle of incidence for observing bare surface roughness and soil moisture at the X-band. All these data can be used as a reference for satellite or spaceborne sensors.
ER -