Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks

Kazuhiro NOGUCHI; Masafumi KOGA

Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks

Kazuhiro NOGUCHI, Masafumi KOGA

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Three-dimensional MEMS optical switches(3D-MEMS) and planar lightwave circuit thermo-optical switches (PLC-TOSW) are suitable for use in large-scale photonic cross-connect switches (PXCs). Usually, such large-scale optical switches are created by integrating many small switch elements (such as 12 switches). Therefore, the reliability or lifetime of the individual switch element greatly affects the reliability of the PXC system. In this paper, the effect of the number and failure probability of switch elements on PXC reliability is statistically estimated. First, the equivalent number of switch elements needed to compose a large-scale PXC is determined for the switch types mentioned above. Based on this evaluation, yields and lifetimes of switch modules are estimated for each switch type. The improvement in reliability due to switch duplication (preparing spare switches) is also estimated and discussed.

Publication: IEICE TRANSACTIONS on Communications Vol.E86-B No.5 pp.1530-1538

Publication Date: 2003/05/01

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Type of Manuscript: Special Section PAPER (Joint Special Issue on Recent Progress in Optoelectronics and Communications)

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Kazuhiro NOGUCHI, Masafumi KOGA, "Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks" in IEICE TRANSACTIONS on Communications, vol. E86-B, no. 5, pp. 1530-1538, May 2003, doi: .
Abstract: Three-dimensional MEMS optical switches(3D-MEMS) and planar lightwave circuit thermo-optical switches (PLC-TOSW) are suitable for use in large-scale photonic cross-connect switches (PXCs). Usually, such large-scale optical switches are created by integrating many small switch elements (such as 12 switches). Therefore, the reliability or lifetime of the individual switch element greatly affects the reliability of the PXC system. In this paper, the effect of the number and failure probability of switch elements on PXC reliability is statistically estimated. First, the equivalent number of switch elements needed to compose a large-scale PXC is determined for the switch types mentioned above. Based on this evaluation, yields and lifetimes of switch modules are estimated for each switch type. The improvement in reliability due to switch duplication (preparing spare switches) is also estimated and discussed.
URL: https://global.ieice.org/en_transactions/communications/10.1587/e86-b_5_1530/_p

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@ARTICLE{e86-b_5_1530,
author={Kazuhiro NOGUCHI, Masafumi KOGA, },
journal={IEICE TRANSACTIONS on Communications},
title={Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks},
year={2003},
volume={E86-B},
number={5},
pages={1530-1538},
abstract={Three-dimensional MEMS optical switches(3D-MEMS) and planar lightwave circuit thermo-optical switches (PLC-TOSW) are suitable for use in large-scale photonic cross-connect switches (PXCs). Usually, such large-scale optical switches are created by integrating many small switch elements (such as 12 switches). Therefore, the reliability or lifetime of the individual switch element greatly affects the reliability of the PXC system. In this paper, the effect of the number and failure probability of switch elements on PXC reliability is statistically estimated. First, the equivalent number of switch elements needed to compose a large-scale PXC is determined for the switch types mentioned above. Based on this evaluation, yields and lifetimes of switch modules are estimated for each switch type. The improvement in reliability due to switch duplication (preparing spare switches) is also estimated and discussed.},
keywords={},
doi={},
ISSN={},
month={May},}

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TY - JOUR
TI - Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks
T2 - IEICE TRANSACTIONS on Communications
SP - 1530
EP - 1538
AU - Kazuhiro NOGUCHI
AU - Masafumi KOGA
PY - 2003
DO -
JO - IEICE TRANSACTIONS on Communications
SN -
VL - E86-B
IS - 5
JA - IEICE TRANSACTIONS on Communications
Y1 - May 2003
AB - Three-dimensional MEMS optical switches(3D-MEMS) and planar lightwave circuit thermo-optical switches (PLC-TOSW) are suitable for use in large-scale photonic cross-connect switches (PXCs). Usually, such large-scale optical switches are created by integrating many small switch elements (such as 12 switches). Therefore, the reliability or lifetime of the individual switch element greatly affects the reliability of the PXC system. In this paper, the effect of the number and failure probability of switch elements on PXC reliability is statistically estimated. First, the equivalent number of switch elements needed to compose a large-scale PXC is determined for the switch types mentioned above. Based on this evaluation, yields and lifetimes of switch modules are estimated for each switch type. The improvement in reliability due to switch duplication (preparing spare switches) is also estimated and discussed.
ER -