Microwave Properties of Sapphire Resonators with a Gap and Their Applicability for Measurements of the Intrinsic Surface Impedance of Thin Superconductor Films

Sang Young LEE; Jae Hun LEE; Woo Il YANG; John H. CLAASSEN

doi:10.1093/ietele/e89-c.2.132

Microwave Properties of Sapphire Resonators with a Gap and Their Applicability for Measurements of the Intrinsic Surface Impedance of Thin Superconductor Films

Sang Young LEE, Jae Hun LEE, Woo Il YANG, John H. CLAASSEN

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A dielectric resonator with a gap between the top plate and the rest has been useful for measuring the penetration depth (λ) of superconductor films, a parameter essential for obtaining the intrinsic microwave surface resistance (R_s) of thin superconductor films. We investigated effects of a gap on the microwave properties of TE_0ml-mode sapphire resonators with a gap between the top plate and the rest of the resonator. Regardless of a 10 µm-gap in TE_0ml-mode sapphire resonators, variations of the TE_0ml-mode resonant frequency on temperature (Δf₀) as well as TE_0ml-mode unloaded Q remained almost the same due to lack of axial currents inside the resonator and negligible radiation effects. The λ of YBa₂Cu₃O_7-δ (YBCO) films obtained from a fit to the temperature-dependent Δf₀ appeared to be 195 nm at 0 K and 19.3 GHz, which was well compared with the corresponding value of 193 nm at 10 kHz measured by the mutual inductance method. The intrinsic R_s of YBCO films on the order of 1 mΩ, and the tan δ of sapphire on the order of 10^-8 at 15 K and 40 GHz could be measured simultaneously using sapphire resonators with a 10 µm-gap.

Publication: IEICE TRANSACTIONS on Electronics Vol.E89-C No.2 pp.132-139

Publication Date: 2006/02/01

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Online ISSN: 1745-1353

DOI: 10.1093/ietele/e89-c.2.132

Type of Manuscript: Special Section PAPER (Special Section on Superconducting High-frequency Devices)

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Sang Young LEE, Jae Hun LEE, Woo Il YANG, John H. CLAASSEN, "Microwave Properties of Sapphire Resonators with a Gap and Their Applicability for Measurements of the Intrinsic Surface Impedance of Thin Superconductor Films" in IEICE TRANSACTIONS on Electronics, vol. E89-C, no. 2, pp. 132-139, February 2006, doi: 10.1093/ietele/e89-c.2.132.
Abstract: A dielectric resonator with a gap between the top plate and the rest has been useful for measuring the penetration depth (λ) of superconductor films, a parameter essential for obtaining the intrinsic microwave surface resistance (R_s) of thin superconductor films. We investigated effects of a gap on the microwave properties of TE_0ml-mode sapphire resonators with a gap between the top plate and the rest of the resonator. Regardless of a 10 µm-gap in TE_0ml-mode sapphire resonators, variations of the TE_0ml-mode resonant frequency on temperature (Δf₀) as well as TE_0ml-mode unloaded Q remained almost the same due to lack of axial currents inside the resonator and negligible radiation effects. The λ of YBa₂Cu₃O_7-δ (YBCO) films obtained from a fit to the temperature-dependent Δf₀ appeared to be 195 nm at 0 K and 19.3 GHz, which was well compared with the corresponding value of 193 nm at 10 kHz measured by the mutual inductance method. The intrinsic R_s of YBCO films on the order of 1 mΩ, and the tan δ of sapphire on the order of 10^-8 at 15 K and 40 GHz could be measured simultaneously using sapphire resonators with a 10 µm-gap.
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e89-c.2.132/_p

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@ARTICLE{e89-c_2_132,
author={Sang Young LEE, Jae Hun LEE, Woo Il YANG, John H. CLAASSEN, },
journal={IEICE TRANSACTIONS on Electronics},
title={Microwave Properties of Sapphire Resonators with a Gap and Their Applicability for Measurements of the Intrinsic Surface Impedance of Thin Superconductor Films},
year={2006},
volume={E89-C},
number={2},
pages={132-139},
abstract={A dielectric resonator with a gap between the top plate and the rest has been useful for measuring the penetration depth (λ) of superconductor films, a parameter essential for obtaining the intrinsic microwave surface resistance (R_s) of thin superconductor films. We investigated effects of a gap on the microwave properties of TE_0ml-mode sapphire resonators with a gap between the top plate and the rest of the resonator. Regardless of a 10 µm-gap in TE_0ml-mode sapphire resonators, variations of the TE_0ml-mode resonant frequency on temperature (Δf₀) as well as TE_0ml-mode unloaded Q remained almost the same due to lack of axial currents inside the resonator and negligible radiation effects. The λ of YBa₂Cu₃O_7-δ (YBCO) films obtained from a fit to the temperature-dependent Δf₀ appeared to be 195 nm at 0 K and 19.3 GHz, which was well compared with the corresponding value of 193 nm at 10 kHz measured by the mutual inductance method. The intrinsic R_s of YBCO films on the order of 1 mΩ, and the tan δ of sapphire on the order of 10^-8 at 15 K and 40 GHz could be measured simultaneously using sapphire resonators with a 10 µm-gap.},
keywords={},
doi={10.1093/ietele/e89-c.2.132},
ISSN={1745-1353},
month={February},}

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TY - JOUR
TI - Microwave Properties of Sapphire Resonators with a Gap and Their Applicability for Measurements of the Intrinsic Surface Impedance of Thin Superconductor Films
T2 - IEICE TRANSACTIONS on Electronics
SP - 132
EP - 139
AU - Sang Young LEE
AU - Jae Hun LEE
AU - Woo Il YANG
AU - John H. CLAASSEN
PY - 2006
DO - 10.1093/ietele/e89-c.2.132
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E89-C
IS - 2
JA - IEICE TRANSACTIONS on Electronics
Y1 - February 2006
AB - A dielectric resonator with a gap between the top plate and the rest has been useful for measuring the penetration depth (λ) of superconductor films, a parameter essential for obtaining the intrinsic microwave surface resistance (R_s) of thin superconductor films. We investigated effects of a gap on the microwave properties of TE_0ml-mode sapphire resonators with a gap between the top plate and the rest of the resonator. Regardless of a 10 µm-gap in TE_0ml-mode sapphire resonators, variations of the TE_0ml-mode resonant frequency on temperature (Δf₀) as well as TE_0ml-mode unloaded Q remained almost the same due to lack of axial currents inside the resonator and negligible radiation effects. The λ of YBa₂Cu₃O_7-δ (YBCO) films obtained from a fit to the temperature-dependent Δf₀ appeared to be 195 nm at 0 K and 19.3 GHz, which was well compared with the corresponding value of 193 nm at 10 kHz measured by the mutual inductance method. The intrinsic R_s of YBCO films on the order of 1 mΩ, and the tan δ of sapphire on the order of 10^-8 at 15 K and 40 GHz could be measured simultaneously using sapphire resonators with a 10 µm-gap.
ER -