Triangular Aperture as Near-Field Element for High-Density Storage

Masakazu HIRATA; Manabu OUMI; Koichi SHIBATA; Kunio NAKAJIMA; Toshifumi OHKUBO

doi:10.1093/ietele/e90-c.1.102

Triangular Aperture as Near-Field Element for High-Density Storage

Masakazu HIRATA, Manabu OUMI, Koichi SHIBATA, Kunio NAKAJIMA, Toshifumi OHKUBO

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Near-field optics is one of super-resolution techniques for future data storage system. We have already proposed a near-field optical flying head with a circular aperture. For realizing higher performance aperture, we developed a triangular one that has been experimentally evaluated with a scanning near-field optical microscope probe. By controlling the polarization of the incident light to the aperture, we could obtain a 100 nm resolution with a 190 nm-wide aperture. We also demonstrate the readout performance of this novel aperture mounted on a near-field head by introducing polarization control. To scan over a medium surface under a small-spacing condition, we fabricate a contact-type head having contact pads and a polarization maintaining fiber, because this type of aperture can only effectively function under a condition of both extremely small spacing and with applied polarized light. The head is fabricated mainly by photolithography. By controlling process conditions, we obtain contact pads at nm accuracy. A measurement of surface configuration using an interferometer shows that the aperture and the contact pads are almost on the same plane within 10 nm. The medium consists of a glass substrate, a titanium layer, a carbon protective layer, and a lubricant layer in this order. Line-and-space (L&S) patterns whose widths are 40-200 nm are formed on the titanium layer. The contact head approaches the medium surface, and then the medium is scanned by a piezo stage. The near-field light generated from the triangular aperture is scattered by the L&S pattern and detected by a photomultiplier tube. Signal readout from the 40 nm-wide L&S patterns is demonstrated with a 170 nm-wide triangular aperture.

Publication: IEICE TRANSACTIONS on Electronics Vol.E90-C No.1 pp.102-109

Publication Date: 2007/01/01

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Online ISSN: 1745-1353

DOI: 10.1093/ietele/e90-c.1.102

Type of Manuscript: Special Section PAPER (Special Section on Microoptomechatronics)

Category: Plasmonics and Nanophotonics

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Masakazu HIRATA, Manabu OUMI, Koichi SHIBATA, Kunio NAKAJIMA, Toshifumi OHKUBO, "Triangular Aperture as Near-Field Element for High-Density Storage" in IEICE TRANSACTIONS on Electronics, vol. E90-C, no. 1, pp. 102-109, January 2007, doi: 10.1093/ietele/e90-c.1.102.
Abstract: Near-field optics is one of super-resolution techniques for future data storage system. We have already proposed a near-field optical flying head with a circular aperture. For realizing higher performance aperture, we developed a triangular one that has been experimentally evaluated with a scanning near-field optical microscope probe. By controlling the polarization of the incident light to the aperture, we could obtain a 100 nm resolution with a 190 nm-wide aperture. We also demonstrate the readout performance of this novel aperture mounted on a near-field head by introducing polarization control. To scan over a medium surface under a small-spacing condition, we fabricate a contact-type head having contact pads and a polarization maintaining fiber, because this type of aperture can only effectively function under a condition of both extremely small spacing and with applied polarized light. The head is fabricated mainly by photolithography. By controlling process conditions, we obtain contact pads at nm accuracy. A measurement of surface configuration using an interferometer shows that the aperture and the contact pads are almost on the same plane within 10 nm. The medium consists of a glass substrate, a titanium layer, a carbon protective layer, and a lubricant layer in this order. Line-and-space (L&S) patterns whose widths are 40-200 nm are formed on the titanium layer. The contact head approaches the medium surface, and then the medium is scanned by a piezo stage. The near-field light generated from the triangular aperture is scattered by the L&S pattern and detected by a photomultiplier tube. Signal readout from the 40 nm-wide L&S patterns is demonstrated with a 170 nm-wide triangular aperture.
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e90-c.1.102/_p

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@ARTICLE{e90-c_1_102,
author={Masakazu HIRATA, Manabu OUMI, Koichi SHIBATA, Kunio NAKAJIMA, Toshifumi OHKUBO, },
journal={IEICE TRANSACTIONS on Electronics},
title={Triangular Aperture as Near-Field Element for High-Density Storage},
year={2007},
volume={E90-C},
number={1},
pages={102-109},
abstract={Near-field optics is one of super-resolution techniques for future data storage system. We have already proposed a near-field optical flying head with a circular aperture. For realizing higher performance aperture, we developed a triangular one that has been experimentally evaluated with a scanning near-field optical microscope probe. By controlling the polarization of the incident light to the aperture, we could obtain a 100 nm resolution with a 190 nm-wide aperture. We also demonstrate the readout performance of this novel aperture mounted on a near-field head by introducing polarization control. To scan over a medium surface under a small-spacing condition, we fabricate a contact-type head having contact pads and a polarization maintaining fiber, because this type of aperture can only effectively function under a condition of both extremely small spacing and with applied polarized light. The head is fabricated mainly by photolithography. By controlling process conditions, we obtain contact pads at nm accuracy. A measurement of surface configuration using an interferometer shows that the aperture and the contact pads are almost on the same plane within 10 nm. The medium consists of a glass substrate, a titanium layer, a carbon protective layer, and a lubricant layer in this order. Line-and-space (L&S) patterns whose widths are 40-200 nm are formed on the titanium layer. The contact head approaches the medium surface, and then the medium is scanned by a piezo stage. The near-field light generated from the triangular aperture is scattered by the L&S pattern and detected by a photomultiplier tube. Signal readout from the 40 nm-wide L&S patterns is demonstrated with a 170 nm-wide triangular aperture.},
keywords={},
doi={10.1093/ietele/e90-c.1.102},
ISSN={1745-1353},
month={January},}

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TY - JOUR
TI - Triangular Aperture as Near-Field Element for High-Density Storage
T2 - IEICE TRANSACTIONS on Electronics
SP - 102
EP - 109
AU - Masakazu HIRATA
AU - Manabu OUMI
AU - Koichi SHIBATA
AU - Kunio NAKAJIMA
AU - Toshifumi OHKUBO
PY - 2007
DO - 10.1093/ietele/e90-c.1.102
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E90-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 2007
AB - Near-field optics is one of super-resolution techniques for future data storage system. We have already proposed a near-field optical flying head with a circular aperture. For realizing higher performance aperture, we developed a triangular one that has been experimentally evaluated with a scanning near-field optical microscope probe. By controlling the polarization of the incident light to the aperture, we could obtain a 100 nm resolution with a 190 nm-wide aperture. We also demonstrate the readout performance of this novel aperture mounted on a near-field head by introducing polarization control. To scan over a medium surface under a small-spacing condition, we fabricate a contact-type head having contact pads and a polarization maintaining fiber, because this type of aperture can only effectively function under a condition of both extremely small spacing and with applied polarized light. The head is fabricated mainly by photolithography. By controlling process conditions, we obtain contact pads at nm accuracy. A measurement of surface configuration using an interferometer shows that the aperture and the contact pads are almost on the same plane within 10 nm. The medium consists of a glass substrate, a titanium layer, a carbon protective layer, and a lubricant layer in this order. Line-and-space (L&S) patterns whose widths are 40-200 nm are formed on the titanium layer. The contact head approaches the medium surface, and then the medium is scanned by a piezo stage. The near-field light generated from the triangular aperture is scattered by the L&S pattern and detected by a photomultiplier tube. Signal readout from the 40 nm-wide L&S patterns is demonstrated with a 170 nm-wide triangular aperture.
ER -