Microwave Characterization of Copper-Clad Dielectric Laminate Substrates
Summary :
Microwave measurement methods necessary to characterize copper-clad dielectric laminate substrates are reviewed to realize more precise design of planar circuits: that is, the balanced-type circular disk resonator method for the relative complex permittivity in the normal direction εrn and tan δn, the cavity resonator method and the cut-off waveguide method for one in the tangential direction εrt and tan δt, and the dielectric resonator method for the surface and interface conductivity of copper foil σs and σi. The measured results of the frequency and temperature dependences of these parameters are presented for a PTFE substrate and a copper-clad glass cloth PTFE laminate substrate.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E90-C No.12 pp.2178-2184
- Publication Date
- 2007/12/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1093/ietele/e90-c.12.2178
- Type of Manuscript
- Special Section INVITED PAPER (Special Section on Recent Technologies for Microwave and Millimeter-wave Passive Devices)
- Category
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Yoshio KOBAYASHI, "Microwave Characterization of Copper-Clad Dielectric Laminate Substrates" in IEICE TRANSACTIONS on Electronics,
vol. E90-C, no. 12, pp. 2178-2184, December 2007, doi: 10.1093/ietele/e90-c.12.2178.
Abstract: Microwave measurement methods necessary to characterize copper-clad dielectric laminate substrates are reviewed to realize more precise design of planar circuits: that is, the balanced-type circular disk resonator method for the relative complex permittivity in the normal direction εrn and tan δn, the cavity resonator method and the cut-off waveguide method for one in the tangential direction εrt and tan δt, and the dielectric resonator method for the surface and interface conductivity of copper foil σs and σi. The measured results of the frequency and temperature dependences of these parameters are presented for a PTFE substrate and a copper-clad glass cloth PTFE laminate substrate.
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e90-c.12.2178/_p
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@ARTICLE{e90-c_12_2178,
author={Yoshio KOBAYASHI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Microwave Characterization of Copper-Clad Dielectric Laminate Substrates},
year={2007},
volume={E90-C},
number={12},
pages={2178-2184},
abstract={Microwave measurement methods necessary to characterize copper-clad dielectric laminate substrates are reviewed to realize more precise design of planar circuits: that is, the balanced-type circular disk resonator method for the relative complex permittivity in the normal direction εrn and tan δn, the cavity resonator method and the cut-off waveguide method for one in the tangential direction εrt and tan δt, and the dielectric resonator method for the surface and interface conductivity of copper foil σs and σi. The measured results of the frequency and temperature dependences of these parameters are presented for a PTFE substrate and a copper-clad glass cloth PTFE laminate substrate.},
keywords={},
doi={10.1093/ietele/e90-c.12.2178},
ISSN={1745-1353},
month={December},}
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TY - JOUR
TI - Microwave Characterization of Copper-Clad Dielectric Laminate Substrates
T2 - IEICE TRANSACTIONS on Electronics
SP - 2178
EP - 2184
AU - Yoshio KOBAYASHI
PY - 2007
DO - 10.1093/ietele/e90-c.12.2178
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E90-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2007
AB - Microwave measurement methods necessary to characterize copper-clad dielectric laminate substrates are reviewed to realize more precise design of planar circuits: that is, the balanced-type circular disk resonator method for the relative complex permittivity in the normal direction εrn and tan δn, the cavity resonator method and the cut-off waveguide method for one in the tangential direction εrt and tan δt, and the dielectric resonator method for the surface and interface conductivity of copper foil σs and σi. The measured results of the frequency and temperature dependences of these parameters are presented for a PTFE substrate and a copper-clad glass cloth PTFE laminate substrate.
ER -
English
