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[Keyword] microwave measurement(7hit)

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  • Noncontact PIM Measurement Method Using Partial Impedance-Matching Method

    Kensuke SAITO  Daijiro ISHIBASHI  Nobuhiro KUGA  

     
    BRIEF PAPER

      Vol:
    E96-C No:9
      Page(s):
    1151-1154

    In this letter, we propose a partial impedance-matching method using a two-strip resonator for noncontact Passive Intermodulation (PIM) measurements using a coaxial tube. It is shown that the strip closer to the inner tube of the coaxial tube is dominant in the observed PIM characteristics while both strips are excited equally. The ideal efficiency of power to each strip is 50%, which is a significant improvement in comparison with conventional methods.

  • An Application of Microwave Measurement for Complex Dielectric Constants to Detecting Snow and Ice on Road Surface

    Kohei OSA  Josaphat Tetuko Sri SUMANTYO  Fumihiko NISHIO  

     
    LETTER

      Vol:
    E94-B No:11
      Page(s):
    2987-2990

    In order to detect snow and ice on a road surface, the microwave measurement method of dielectric constants are presented. And some examples of measurements for artificial and natural snow and ice using the method are introduced. The results show reasonable estimations of the dielectric constants, and they indicate that the method could be utilized for the snow and ice detection.

  • Microwave Characterization of Copper-Clad Dielectric Laminate Substrates

    Yoshio KOBAYASHI  

     
    INVITED PAPER

      Vol:
    E90-C No:12
      Page(s):
    2178-2184

    Microwave measurement methods necessary to characterize copper-clad dielectric laminate substrates are reviewed to realize more precise design of planar circuits: that is, the balanced-type circular disk resonator method for the relative complex permittivity in the normal direction εrn and tan δn, the cavity resonator method and the cut-off waveguide method for one in the tangential direction εrt and tan δt, and the dielectric resonator method for the surface and interface conductivity of copper foil σs and σi. The measured results of the frequency and temperature dependences of these parameters are presented for a PTFE substrate and a copper-clad glass cloth PTFE laminate substrate.

  • A Vector Network Analyzer Based on Seven-Port Wave-Correlator

    Toshiyuki YAKABE  Fengchao XIAO  

     
    PAPER-Measuring Techniques

      Vol:
    E88-C No:7
      Page(s):
    1483-1489

    A seven-port wave-correlator based vector network analyzer is proposed. The seven-port wave-correlator is a combination of two six-port wave-correlators which share common components. Furthermore, the complex wave ratio measurement accuracy is improved since the input signals can be directly detected by the side-arm ports. A seven-port wave-correlator is fabricated using microstrip branch line couplers. The performance of the wave-correlator and the constructed network analyzer are evaluated, and the measurement accuracy is confirmed.

  • Electro-Optic Probing for Microwave Diagnostics

    John F. WHITAKER  Kyoung YANG  Ronald REANO  Linda P. B. KATEHI  

     
    INVITED PAPER-Measurements Techniques

      Vol:
    E86-C No:7
      Page(s):
    1328-1337

    This review paper addresses an emerging aspect of the relationship between optics and microwave electronics: the application of short pulses of laser light to the sensing and measurement of continuous-wave microwave fields. In particular, very short duration optical pulses can take on the role of ultrafast sampling gates within the framework of the electro-optic sampling technique in order to realize unprecedented temporal resolution, measurement bandwidth, and probing flexibility. As a result, in numerous instances electro-optic sampling has been demonstrated, primarily within the research laboratory, to be an effective tool in the field of diagnostic testing and the determination of the electrical characteristics of microwave components. Recently, with the emergence of new applications such as microwave electric-field mapping in wireless and radar environments, and as the ultrafast time domain has gained in importance for the area of optical telecommunications, added attention has been directed to electro-optic sampling. Herein, an abbreviated historical perspective of the history of electro-optic field mapping is presented, along with the fundamental concepts that are utilized in the technique. The effectiveness of an optical-fiber-mounted electro-optic probe in a scanning electric-field-mapping system is highlighted in several diagnostic measurements on microwave and millimeter-wave antenna arrays, and a combined electric-field and thermal-imaging capability is also introduced.

  • A Simple Adapter De-Embedding Method in the Six-Port Calibration Process Using a Scalar Analyzer

    Toshiyuki YAKABE  Hatsuo YABE  

     
    PAPER

      Vol:
    E77-C No:6
      Page(s):
    925-929

    A simple adapter de-embedding method is presented in a six-port calibration process using only one sliding load and one standard short. Adapter de-embedding is performed to extract the S-parameters of the adapter from the six-port system parameters. The concept of this method is based on the relations between the S-parameters and the Fourier coefficients of the periodic return loss of the adapter. To complete the de-embedding procedure, there are two measurement steps: one is return loss measurement with the sliding load, and the other, sidearm power measurement with the standard short. Using these measured values, unique solutions of the S-parameters are determined. A computer-controlled six-port with 2.4 mm coaxial-type connector was designed for calibration using a waveguide-type sliding load over the frequency range of 8.5-12.0 GHz. Through experiments, the adapter for joining two unlike connector types was measured. Then the reflection coefficients of the adapter with the sliding load measured by the calibrated six-port and those calculated from the S-parameters were compared with each other. As a result, an overall good agreement with standard deviation of less than 0.1% was found at all setting frequencies. One of the main features of the method is that the S-prameters of a two-port as well as the system parameters of a six-port can be determined by means of simple scalar measurement.

  • A Simple Method for Separating Dissipation Factors in Microwave Printed Circuit Boards

    Hiroyuki TANAKA  Fumiaki OKADA  

     
    PAPER

      Vol:
    E77-C No:6
      Page(s):
    913-918

    A simple method for separating the dissipation factors associated with both conductor losses and dielectric losses of printed circuit boards in microwave frequencies is presented. This method utilizes the difference in dependence of two dissipation factors on the dimensions of bounded stripline resonators using a single printed circuit board specimen as a center strip conductor. In this method, the separation is made through a procedure involving the comparison of the measured values of the total dissipation factor with those numerically calculated for the resonators. A method, which is based on a TEM wave approximation and uses Green's function and a variational principle, is used for the numerical calculation. Both effective conductivity for three kinds of industrial copper conductor supported with a substrate of polymide film and dielectric loss tangent of the substrates are determined using this method from the values of the unloaded Q measured at the 10 GHz region. Radiation losses from the resonator affecting the accuracy of the separation are discussed, as well as the values of the effective conductivity of metals on the polyimide substrate which is calculated using the above method. The resulting values of the effective conductivity agree with those using the triplateline method within 10%.