IEICE TRANSACTIONS on Electronics
Wide Dynamic Range Image Sensor with Polygonal-Line I/O Characteristic Adapted to Brightness Distribution of Objects
Summary :
We propose a CMOS image sensor that realizes wide dynamic range imaging and nonlinear representation of I/O characteristics. The proposed image sensor controls the integration time for each pixel based on the brightness distribution of objects. The histogram at the end of the integration is estimated from the early intermediate photodiode values that are read out to an external circuit. Using the estimated histogram, the imaging parameters, which control the integration time pixel-by-pixel, are optimized in the external circuit. According to the imaging parameters, the intermediate photodiode value is compared with the threshold and reset to the starting value depending on the comparison result. These processes repeat several times. At the end of the integration, the photodiode value is reconstructed by using the imaging parameters. Then, wide dynamic range images with adapted I/O characteristics are obtained. We have fabricated a prototype with a size of 64
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E91-C No.9 pp.1402-1408
- Publication Date
- 2008/09/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1093/ietele/e91-c.9.1402
- Type of Manuscript
- Special Section PAPER (Special Section on Advanced Processors Based on Novel Concepts in Computation)
- Category
Authors
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Satoko KAGAMI, Fumitsugu SUZUKI, Takayuki HAMAMOTO, "Wide Dynamic Range Image Sensor with Polygonal-Line I/O Characteristic Adapted to Brightness Distribution of Objects" in IEICE TRANSACTIONS on Electronics,
vol. E91-C, no. 9, pp. 1402-1408, September 2008, doi: 10.1093/ietele/e91-c.9.1402.
Abstract: We propose a CMOS image sensor that realizes wide dynamic range imaging and nonlinear representation of I/O characteristics. The proposed image sensor controls the integration time for each pixel based on the brightness distribution of objects. The histogram at the end of the integration is estimated from the early intermediate photodiode values that are read out to an external circuit. Using the estimated histogram, the imaging parameters, which control the integration time pixel-by-pixel, are optimized in the external circuit. According to the imaging parameters, the intermediate photodiode value is compared with the threshold and reset to the starting value depending on the comparison result. These processes repeat several times. At the end of the integration, the photodiode value is reconstructed by using the imaging parameters. Then, wide dynamic range images with adapted I/O characteristics are obtained. We have fabricated a prototype with a size of 64
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e91-c.9.1402/_p
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@ARTICLE{e91-c_9_1402,
author={Satoko KAGAMI, Fumitsugu SUZUKI, Takayuki HAMAMOTO, },
journal={IEICE TRANSACTIONS on Electronics},
title={Wide Dynamic Range Image Sensor with Polygonal-Line I/O Characteristic Adapted to Brightness Distribution of Objects},
year={2008},
volume={E91-C},
number={9},
pages={1402-1408},
abstract={We propose a CMOS image sensor that realizes wide dynamic range imaging and nonlinear representation of I/O characteristics. The proposed image sensor controls the integration time for each pixel based on the brightness distribution of objects. The histogram at the end of the integration is estimated from the early intermediate photodiode values that are read out to an external circuit. Using the estimated histogram, the imaging parameters, which control the integration time pixel-by-pixel, are optimized in the external circuit. According to the imaging parameters, the intermediate photodiode value is compared with the threshold and reset to the starting value depending on the comparison result. These processes repeat several times. At the end of the integration, the photodiode value is reconstructed by using the imaging parameters. Then, wide dynamic range images with adapted I/O characteristics are obtained. We have fabricated a prototype with a size of 64
keywords={},
doi={10.1093/ietele/e91-c.9.1402},
ISSN={1745-1353},
month={September},}
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TY - JOUR
TI - Wide Dynamic Range Image Sensor with Polygonal-Line I/O Characteristic Adapted to Brightness Distribution of Objects
T2 - IEICE TRANSACTIONS on Electronics
SP - 1402
EP - 1408
AU - Satoko KAGAMI
AU - Fumitsugu SUZUKI
AU - Takayuki HAMAMOTO
PY - 2008
DO - 10.1093/ietele/e91-c.9.1402
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E91-C
IS - 9
JA - IEICE TRANSACTIONS on Electronics
Y1 - September 2008
AB - We propose a CMOS image sensor that realizes wide dynamic range imaging and nonlinear representation of I/O characteristics. The proposed image sensor controls the integration time for each pixel based on the brightness distribution of objects. The histogram at the end of the integration is estimated from the early intermediate photodiode values that are read out to an external circuit. Using the estimated histogram, the imaging parameters, which control the integration time pixel-by-pixel, are optimized in the external circuit. According to the imaging parameters, the intermediate photodiode value is compared with the threshold and reset to the starting value depending on the comparison result. These processes repeat several times. At the end of the integration, the photodiode value is reconstructed by using the imaging parameters. Then, wide dynamic range images with adapted I/O characteristics are obtained. We have fabricated a prototype with a size of 64
ER -
English
