An automatic optimization system for semiconductor devices has been built-up by fully interfacing an optimizer and a device-analysis code supplemented with sensitivity analysis. The device-analysis code is thought of as a part of a pipeline of simulators. The latters are regarded as subprocesses by the optimizer, which controls their I/O stream. The action of the pipeline is iterated until the optimum set of design parameters is determined. An important feature of the system is that all the derivatives required in the sensitivity analysis are calculated analytically, this providing a substantial improvement in both the numerical accuracy and computational efficiency, and making the scheme attractive from the application standpoint. A few examples of optimization of MOS devices are shown and the performance is reported, indicating that a system of this kind can usefully be exploited in a design environment.
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
Massimo RUDAN, Maria Cristina VECCHI, Antonio GNUDI, "Integrated Tools for Device Optimization" in IEICE TRANSACTIONS on Electronics,
vol. E75-C, no. 2, pp. 216-225, February 1992, doi: .
Abstract: An automatic optimization system for semiconductor devices has been built-up by fully interfacing an optimizer and a device-analysis code supplemented with sensitivity analysis. The device-analysis code is thought of as a part of a pipeline of simulators. The latters are regarded as subprocesses by the optimizer, which controls their I/O stream. The action of the pipeline is iterated until the optimum set of design parameters is determined. An important feature of the system is that all the derivatives required in the sensitivity analysis are calculated analytically, this providing a substantial improvement in both the numerical accuracy and computational efficiency, and making the scheme attractive from the application standpoint. A few examples of optimization of MOS devices are shown and the performance is reported, indicating that a system of this kind can usefully be exploited in a design environment.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e75-c_2_216/_p
Copy
@ARTICLE{e75-c_2_216,
author={Massimo RUDAN, Maria Cristina VECCHI, Antonio GNUDI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Integrated Tools for Device Optimization},
year={1992},
volume={E75-C},
number={2},
pages={216-225},
abstract={An automatic optimization system for semiconductor devices has been built-up by fully interfacing an optimizer and a device-analysis code supplemented with sensitivity analysis. The device-analysis code is thought of as a part of a pipeline of simulators. The latters are regarded as subprocesses by the optimizer, which controls their I/O stream. The action of the pipeline is iterated until the optimum set of design parameters is determined. An important feature of the system is that all the derivatives required in the sensitivity analysis are calculated analytically, this providing a substantial improvement in both the numerical accuracy and computational efficiency, and making the scheme attractive from the application standpoint. A few examples of optimization of MOS devices are shown and the performance is reported, indicating that a system of this kind can usefully be exploited in a design environment.},
keywords={},
doi={},
ISSN={},
month={February},}
Copy
TY - JOUR
TI - Integrated Tools for Device Optimization
T2 - IEICE TRANSACTIONS on Electronics
SP - 216
EP - 225
AU - Massimo RUDAN
AU - Maria Cristina VECCHI
AU - Antonio GNUDI
PY - 1992
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E75-C
IS - 2
JA - IEICE TRANSACTIONS on Electronics
Y1 - February 1992
AB - An automatic optimization system for semiconductor devices has been built-up by fully interfacing an optimizer and a device-analysis code supplemented with sensitivity analysis. The device-analysis code is thought of as a part of a pipeline of simulators. The latters are regarded as subprocesses by the optimizer, which controls their I/O stream. The action of the pipeline is iterated until the optimum set of design parameters is determined. An important feature of the system is that all the derivatives required in the sensitivity analysis are calculated analytically, this providing a substantial improvement in both the numerical accuracy and computational efficiency, and making the scheme attractive from the application standpoint. A few examples of optimization of MOS devices are shown and the performance is reported, indicating that a system of this kind can usefully be exploited in a design environment.
ER -