Formation of thin insulating SiO2 films by anodic oxidation of silicon was studied as a part of investigating an alternative method of fabricating low-cost silicon MIS solar cells. Anodization in the constant-voltage mode was carried out in nonaqueous ethylene glycol solution. The film thickness was carefully measured using an ellipsometer of wavelength 6238
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Junji NANJO, Kamal Abu Hena MOSTAFA, Kiyoyasu TAKADA, Yutaka KOBAYASHI, Toshihide MIYAZAKI, Shigeru NOMURA, "Si MIS Solar Cells by Anodization" in IEICE TRANSACTIONS on Electronics,
vol. E76-C, no. 1, pp. 136-141, January 1993, doi: .
Abstract: Formation of thin insulating SiO2 films by anodic oxidation of silicon was studied as a part of investigating an alternative method of fabricating low-cost silicon MIS solar cells. Anodization in the constant-voltage mode was carried out in nonaqueous ethylene glycol solution. The film thickness was carefully measured using an ellipsometer of wavelength 6238
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e76-c_1_136/_p
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@ARTICLE{e76-c_1_136,
author={Junji NANJO, Kamal Abu Hena MOSTAFA, Kiyoyasu TAKADA, Yutaka KOBAYASHI, Toshihide MIYAZAKI, Shigeru NOMURA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Si MIS Solar Cells by Anodization},
year={1993},
volume={E76-C},
number={1},
pages={136-141},
abstract={Formation of thin insulating SiO2 films by anodic oxidation of silicon was studied as a part of investigating an alternative method of fabricating low-cost silicon MIS solar cells. Anodization in the constant-voltage mode was carried out in nonaqueous ethylene glycol solution. The film thickness was carefully measured using an ellipsometer of wavelength 6238
keywords={},
doi={},
ISSN={},
month={January},}
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TY - JOUR
TI - Si MIS Solar Cells by Anodization
T2 - IEICE TRANSACTIONS on Electronics
SP - 136
EP - 141
AU - Junji NANJO
AU - Kamal Abu Hena MOSTAFA
AU - Kiyoyasu TAKADA
AU - Yutaka KOBAYASHI
AU - Toshihide MIYAZAKI
AU - Shigeru NOMURA
PY - 1993
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E76-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 1993
AB - Formation of thin insulating SiO2 films by anodic oxidation of silicon was studied as a part of investigating an alternative method of fabricating low-cost silicon MIS solar cells. Anodization in the constant-voltage mode was carried out in nonaqueous ethylene glycol solution. The film thickness was carefully measured using an ellipsometer of wavelength 6238
ER -