Characterization of Microstrip Lines Near Edge of Dielectric Substrate with Rectangular Boundary Division Method
Summary :
In this paper, the characteristics of microstrip lines near the edge of dielectric substrate are analyzed by improving the rectangular boundary division method. The numerical results indicate the changes of the characteristics of a microstrip line when the strip conductor is closely located to the edge. When the distance the dielectric substrate edge to the strip conductor is less than the thickness of dielectric substrate, the effects of the edge on the line characteristics are no longer negligible. The numerical results in this paper show high computation accuracy without increasing computation time. Our improvement is effective for the analysis of the microstrip lines both for the narrow strip conductor and the strip conductor close to the edge. The relative errors between the numerical results and the measured values are less than 1.2%.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E76-C No.6 pp.977-984
- Publication Date
- 1993/06/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Microwave and Millimeter-Wave Technology for Advanced Functions and Size-Reductions)
- Category
Authors
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Keren LI, Kazuhiko ATSUKI, Hitoshi YAJIMA, Eikichi YAMASHITA, "Characterization of Microstrip Lines Near Edge of Dielectric Substrate with Rectangular Boundary Division Method" in IEICE TRANSACTIONS on Electronics,
vol. E76-C, no. 6, pp. 977-984, June 1993, doi: .
Abstract: In this paper, the characteristics of microstrip lines near the edge of dielectric substrate are analyzed by improving the rectangular boundary division method. The numerical results indicate the changes of the characteristics of a microstrip line when the strip conductor is closely located to the edge. When the distance the dielectric substrate edge to the strip conductor is less than the thickness of dielectric substrate, the effects of the edge on the line characteristics are no longer negligible. The numerical results in this paper show high computation accuracy without increasing computation time. Our improvement is effective for the analysis of the microstrip lines both for the narrow strip conductor and the strip conductor close to the edge. The relative errors between the numerical results and the measured values are less than 1.2%.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e76-c_6_977/_p
Copy
@ARTICLE{e76-c_6_977,
author={Keren LI, Kazuhiko ATSUKI, Hitoshi YAJIMA, Eikichi YAMASHITA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Characterization of Microstrip Lines Near Edge of Dielectric Substrate with Rectangular Boundary Division Method},
year={1993},
volume={E76-C},
number={6},
pages={977-984},
abstract={In this paper, the characteristics of microstrip lines near the edge of dielectric substrate are analyzed by improving the rectangular boundary division method. The numerical results indicate the changes of the characteristics of a microstrip line when the strip conductor is closely located to the edge. When the distance the dielectric substrate edge to the strip conductor is less than the thickness of dielectric substrate, the effects of the edge on the line characteristics are no longer negligible. The numerical results in this paper show high computation accuracy without increasing computation time. Our improvement is effective for the analysis of the microstrip lines both for the narrow strip conductor and the strip conductor close to the edge. The relative errors between the numerical results and the measured values are less than 1.2%.},
keywords={},
doi={},
ISSN={},
month={June},}
Copy
TY - JOUR
TI - Characterization of Microstrip Lines Near Edge of Dielectric Substrate with Rectangular Boundary Division Method
T2 - IEICE TRANSACTIONS on Electronics
SP - 977
EP - 984
AU - Keren LI
AU - Kazuhiko ATSUKI
AU - Hitoshi YAJIMA
AU - Eikichi YAMASHITA
PY - 1993
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E76-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 1993
AB - In this paper, the characteristics of microstrip lines near the edge of dielectric substrate are analyzed by improving the rectangular boundary division method. The numerical results indicate the changes of the characteristics of a microstrip line when the strip conductor is closely located to the edge. When the distance the dielectric substrate edge to the strip conductor is less than the thickness of dielectric substrate, the effects of the edge on the line characteristics are no longer negligible. The numerical results in this paper show high computation accuracy without increasing computation time. Our improvement is effective for the analysis of the microstrip lines both for the narrow strip conductor and the strip conductor close to the edge. The relative errors between the numerical results and the measured values are less than 1.2%.
ER -
English
