Capacitance and Resistance Measurement of Au/PrBa2Cu3Oy/YBa2Cu3Ox Structure at 4.2K

Toshiaki OHMAMEUDA; Yoichi OKABE

Capacitance and Resistance Measurement of Au/PrBa₂Cu₃O_y/YBa₂Cu₃O_x Structure at 4.2K

Toshiaki OHMAMEUDA, Yoichi OKABE

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The capacitance and the resistance of the Au/PrBa₂Cu₃O_y (PBCO)/YBa₂Cu₃O_x (YBCO) structure were measured at liquid helium temperature. A film of YBCO was deposited by rf magnetron sputtering at 700, and its thickness was 250 nm. A film of PBCO was deposited by rf magnetron sputtering at 690, and its thickness was less than 375 nm. The inverse capacitance and the resistance of the structure increased with PBCO thickness when PBCO thickness was more than 70 nm. However, the inverse capacitance was near zero, and the resistance was much less than that of PBCO itself when PBCO thickness was less than 70 nm. These results show the possibility that the electric property of PBCO within 70 nm from the PBCO/YBCO interface is different from that of PBCO itself, that is, there is a low-resistance region in PBCO near the YBCO/PBCO interface.

Publication: IEICE TRANSACTIONS on Electronics Vol.E78-C No.5 pp.476-480

Publication Date: 1995/05/25

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Type of Manuscript: Special Section PAPER (Special Issue on Superconducting Electronics and Its Applications)

Category: Three terminal devices and Josephson Junctions

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Toshiaki OHMAMEUDA, Yoichi OKABE, "Capacitance and Resistance Measurement of Au/PrBa2Cu3Oy/YBa2Cu3Ox Structure at 4.2K" in IEICE TRANSACTIONS on Electronics, vol. E78-C, no. 5, pp. 476-480, May 1995, doi: .
Abstract: The capacitance and the resistance of the Au/PrBa₂Cu₃O_y (PBCO)/YBa₂Cu₃O_x (YBCO) structure were measured at liquid helium temperature. A film of YBCO was deposited by rf magnetron sputtering at 700, and its thickness was 250 nm. A film of PBCO was deposited by rf magnetron sputtering at 690, and its thickness was less than 375 nm. The inverse capacitance and the resistance of the structure increased with PBCO thickness when PBCO thickness was more than 70 nm. However, the inverse capacitance was near zero, and the resistance was much less than that of PBCO itself when PBCO thickness was less than 70 nm. These results show the possibility that the electric property of PBCO within 70 nm from the PBCO/YBCO interface is different from that of PBCO itself, that is, there is a low-resistance region in PBCO near the YBCO/PBCO interface.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e78-c_5_476/_p

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@ARTICLE{e78-c_5_476,
author={Toshiaki OHMAMEUDA, Yoichi OKABE, },
journal={IEICE TRANSACTIONS on Electronics},
title={Capacitance and Resistance Measurement of Au/PrBa2Cu3Oy/YBa2Cu3Ox Structure at 4.2K},
year={1995},
volume={E78-C},
number={5},
pages={476-480},
abstract={The capacitance and the resistance of the Au/PrBa₂Cu₃O_y (PBCO)/YBa₂Cu₃O_x (YBCO) structure were measured at liquid helium temperature. A film of YBCO was deposited by rf magnetron sputtering at 700, and its thickness was 250 nm. A film of PBCO was deposited by rf magnetron sputtering at 690, and its thickness was less than 375 nm. The inverse capacitance and the resistance of the structure increased with PBCO thickness when PBCO thickness was more than 70 nm. However, the inverse capacitance was near zero, and the resistance was much less than that of PBCO itself when PBCO thickness was less than 70 nm. These results show the possibility that the electric property of PBCO within 70 nm from the PBCO/YBCO interface is different from that of PBCO itself, that is, there is a low-resistance region in PBCO near the YBCO/PBCO interface.},
keywords={},
doi={},
ISSN={},
month={May},}

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TY - JOUR
TI - Capacitance and Resistance Measurement of Au/PrBa2Cu3Oy/YBa2Cu3Ox Structure at 4.2K
T2 - IEICE TRANSACTIONS on Electronics
SP - 476
EP - 480
AU - Toshiaki OHMAMEUDA
AU - Yoichi OKABE
PY - 1995
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E78-C
IS - 5
JA - IEICE TRANSACTIONS on Electronics
Y1 - May 1995
AB - The capacitance and the resistance of the Au/PrBa₂Cu₃O_y (PBCO)/YBa₂Cu₃O_x (YBCO) structure were measured at liquid helium temperature. A film of YBCO was deposited by rf magnetron sputtering at 700, and its thickness was 250 nm. A film of PBCO was deposited by rf magnetron sputtering at 690, and its thickness was less than 375 nm. The inverse capacitance and the resistance of the structure increased with PBCO thickness when PBCO thickness was more than 70 nm. However, the inverse capacitance was near zero, and the resistance was much less than that of PBCO itself when PBCO thickness was less than 70 nm. These results show the possibility that the electric property of PBCO within 70 nm from the PBCO/YBCO interface is different from that of PBCO itself, that is, there is a low-resistance region in PBCO near the YBCO/PBCO interface.
ER -

Capacitance and Resistance Measurement of Au/PrBa₂Cu₃O_y/YBa₂Cu₃O_x Structure at 4.2K

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