Complex Permittivity Measurement at Pseudo Microwave Frequency Using a Dielectric-Plate-Loaded Cavity Resonator

Akira NAKAYAMA; Atsuomi FUKUURA; Michiaki NISHIMURA

Complex Permittivity Measurement at Pseudo Microwave Frequency Using a Dielectric-Plate-Loaded Cavity Resonator

Akira NAKAYAMA, Atsuomi FUKUURA, Michiaki NISHIMURA

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This paper describes a nondestructive measurement method for complex permittivity of dielectric plates at 2 GHz, using a cylindrical cavity resonator. The resonator is divided into two parts at the center. Two dielectric plates are symmetrically loaded around the center of the cavity. These plates have high permittivity of 45. A dielectric plate specimen is clamped with these halves. The values of relative permittivity ε and loss tangent tanδ of the specimen are obtained from the resonant frequency and unloaded Q-value of TE₀₁₁ mode. Measured results of various materials are compared with those values obtained at 3 and 10 GHz by other cavity resonator method. An edge effect is taken into account by a reference method, using measurement data of a sapphire plate. The errors of the present method are smaller than 1% and 2-310^-5 for ε and tanδ, respectively.

Publication: IEICE TRANSACTIONS on Electronics Vol.E80-C No.8 pp.1117-1125

Publication Date: 1997/08/25

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Category: Microwave and Millimeter Wave Technology

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Akira NAKAYAMA, Atsuomi FUKUURA, Michiaki NISHIMURA, "Complex Permittivity Measurement at Pseudo Microwave Frequency Using a Dielectric-Plate-Loaded Cavity Resonator" in IEICE TRANSACTIONS on Electronics, vol. E80-C, no. 8, pp. 1117-1125, August 1997, doi: .
Abstract: This paper describes a nondestructive measurement method for complex permittivity of dielectric plates at 2 GHz, using a cylindrical cavity resonator. The resonator is divided into two parts at the center. Two dielectric plates are symmetrically loaded around the center of the cavity. These plates have high permittivity of 45. A dielectric plate specimen is clamped with these halves. The values of relative permittivity ε and loss tangent tanδ of the specimen are obtained from the resonant frequency and unloaded Q-value of TE₀₁₁ mode. Measured results of various materials are compared with those values obtained at 3 and 10 GHz by other cavity resonator method. An edge effect is taken into account by a reference method, using measurement data of a sapphire plate. The errors of the present method are smaller than 1% and 2-310^-5 for ε and tanδ, respectively.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e80-c_8_1117/_p

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@ARTICLE{e80-c_8_1117,
author={Akira NAKAYAMA, Atsuomi FUKUURA, Michiaki NISHIMURA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Complex Permittivity Measurement at Pseudo Microwave Frequency Using a Dielectric-Plate-Loaded Cavity Resonator},
year={1997},
volume={E80-C},
number={8},
pages={1117-1125},
abstract={This paper describes a nondestructive measurement method for complex permittivity of dielectric plates at 2 GHz, using a cylindrical cavity resonator. The resonator is divided into two parts at the center. Two dielectric plates are symmetrically loaded around the center of the cavity. These plates have high permittivity of 45. A dielectric plate specimen is clamped with these halves. The values of relative permittivity ε and loss tangent tanδ of the specimen are obtained from the resonant frequency and unloaded Q-value of TE₀₁₁ mode. Measured results of various materials are compared with those values obtained at 3 and 10 GHz by other cavity resonator method. An edge effect is taken into account by a reference method, using measurement data of a sapphire plate. The errors of the present method are smaller than 1% and 2-310^-5 for ε and tanδ, respectively.},
keywords={},
doi={},
ISSN={},
month={August},}

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TY - JOUR
TI - Complex Permittivity Measurement at Pseudo Microwave Frequency Using a Dielectric-Plate-Loaded Cavity Resonator
T2 - IEICE TRANSACTIONS on Electronics
SP - 1117
EP - 1125
AU - Akira NAKAYAMA
AU - Atsuomi FUKUURA
AU - Michiaki NISHIMURA
PY - 1997
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E80-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 1997
AB - This paper describes a nondestructive measurement method for complex permittivity of dielectric plates at 2 GHz, using a cylindrical cavity resonator. The resonator is divided into two parts at the center. Two dielectric plates are symmetrically loaded around the center of the cavity. These plates have high permittivity of 45. A dielectric plate specimen is clamped with these halves. The values of relative permittivity ε and loss tangent tanδ of the specimen are obtained from the resonant frequency and unloaded Q-value of TE₀₁₁ mode. Measured results of various materials are compared with those values obtained at 3 and 10 GHz by other cavity resonator method. An edge effect is taken into account by a reference method, using measurement data of a sapphire plate. The errors of the present method are smaller than 1% and 2-310^-5 for ε and tanδ, respectively.
ER -