Application of Digital Image Measuring System (DIMS) and Shadow Image Processing Technique (SIPT) to Damage Analysis of Electrical Sliding Contact Surface
Summary :
Surface damage of the electrical contact is a primary cause of failure in many electronic devices which use sliding contacts. Therefore, the quantitative observation of the contact surface is one of the most important subjects for improvement of contact reliability. In this study, in order to clarify the relationship between the contact resistance and the damage on the contact surface, a digital image measuring system (DIMS) was developed. A shadow image processing technique (SIPT) was applied to the damage analysis on the sliding contact surface. The damage width on the contact surface and the damaged image could be obtained with a 3-D graphic image by applying both DIMS and SIPT. Part of the relationship between the damage on the contact surface and the contact resistance could be obtained in the case when Cu is used for the moving contact and Cu and Ni are used for the static contact.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E81-C No.3 pp.377-383
- Publication Date
- 1998/03/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Electromechanical Devices and their Surface Science)
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Masanari TANIGUCHI, Miyataka KANAZAWA, Tasuku TAKAGI, "Application of Digital Image Measuring System (DIMS) and Shadow Image Processing Technique (SIPT) to Damage Analysis of Electrical Sliding Contact Surface" in IEICE TRANSACTIONS on Electronics,
vol. E81-C, no. 3, pp. 377-383, March 1998, doi: .
Abstract: Surface damage of the electrical contact is a primary cause of failure in many electronic devices which use sliding contacts. Therefore, the quantitative observation of the contact surface is one of the most important subjects for improvement of contact reliability. In this study, in order to clarify the relationship between the contact resistance and the damage on the contact surface, a digital image measuring system (DIMS) was developed. A shadow image processing technique (SIPT) was applied to the damage analysis on the sliding contact surface. The damage width on the contact surface and the damaged image could be obtained with a 3-D graphic image by applying both DIMS and SIPT. Part of the relationship between the damage on the contact surface and the contact resistance could be obtained in the case when Cu is used for the moving contact and Cu and Ni are used for the static contact.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e81-c_3_377/_p
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@ARTICLE{e81-c_3_377,
author={Masanari TANIGUCHI, Miyataka KANAZAWA, Tasuku TAKAGI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Application of Digital Image Measuring System (DIMS) and Shadow Image Processing Technique (SIPT) to Damage Analysis of Electrical Sliding Contact Surface},
year={1998},
volume={E81-C},
number={3},
pages={377-383},
abstract={Surface damage of the electrical contact is a primary cause of failure in many electronic devices which use sliding contacts. Therefore, the quantitative observation of the contact surface is one of the most important subjects for improvement of contact reliability. In this study, in order to clarify the relationship between the contact resistance and the damage on the contact surface, a digital image measuring system (DIMS) was developed. A shadow image processing technique (SIPT) was applied to the damage analysis on the sliding contact surface. The damage width on the contact surface and the damaged image could be obtained with a 3-D graphic image by applying both DIMS and SIPT. Part of the relationship between the damage on the contact surface and the contact resistance could be obtained in the case when Cu is used for the moving contact and Cu and Ni are used for the static contact.},
keywords={},
doi={},
ISSN={},
month={March},}
Copy
TY - JOUR
TI - Application of Digital Image Measuring System (DIMS) and Shadow Image Processing Technique (SIPT) to Damage Analysis of Electrical Sliding Contact Surface
T2 - IEICE TRANSACTIONS on Electronics
SP - 377
EP - 383
AU - Masanari TANIGUCHI
AU - Miyataka KANAZAWA
AU - Tasuku TAKAGI
PY - 1998
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E81-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 1998
AB - Surface damage of the electrical contact is a primary cause of failure in many electronic devices which use sliding contacts. Therefore, the quantitative observation of the contact surface is one of the most important subjects for improvement of contact reliability. In this study, in order to clarify the relationship between the contact resistance and the damage on the contact surface, a digital image measuring system (DIMS) was developed. A shadow image processing technique (SIPT) was applied to the damage analysis on the sliding contact surface. The damage width on the contact surface and the damaged image could be obtained with a 3-D graphic image by applying both DIMS and SIPT. Part of the relationship between the damage on the contact surface and the contact resistance could be obtained in the case when Cu is used for the moving contact and Cu and Ni are used for the static contact.
ER -
English
