A simple circuit structure implementing digital-to-analog data conversion function is presented. The proposed digital-to-analog converter utilizes the inherent characters of single-electron tunneling which consist of the periodic voltage oscillation and the ability of counting the number of trapped charges. It produces an analog output voltage for a given digital input. We proposed the device structure performing the weighted summation of inputs, which is converted into an analog voltage by the proposed sensing circuit. Monte Carlo simulation results give us the clear performance of the 3-bit digital-to-analog conversion function and the effect of temperature, capacitance variations, and background charge fluctuations. Moreover, we examined the possibility of extending a N-bit digital-to-analog converter with the proposed scheme.
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Su Jin AHN, Dae Mann KIM, "A Simple Digital-to-Analog Conversion Technique Using Single-Electron Transistor" in IEICE TRANSACTIONS on Electronics,
vol. E81-C, no. 4, pp. 608-611, April 1998, doi: .
Abstract: A simple circuit structure implementing digital-to-analog data conversion function is presented. The proposed digital-to-analog converter utilizes the inherent characters of single-electron tunneling which consist of the periodic voltage oscillation and the ability of counting the number of trapped charges. It produces an analog output voltage for a given digital input. We proposed the device structure performing the weighted summation of inputs, which is converted into an analog voltage by the proposed sensing circuit. Monte Carlo simulation results give us the clear performance of the 3-bit digital-to-analog conversion function and the effect of temperature, capacitance variations, and background charge fluctuations. Moreover, we examined the possibility of extending a N-bit digital-to-analog converter with the proposed scheme.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e81-c_4_608/_p
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@ARTICLE{e81-c_4_608,
author={Su Jin AHN, Dae Mann KIM, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Simple Digital-to-Analog Conversion Technique Using Single-Electron Transistor},
year={1998},
volume={E81-C},
number={4},
pages={608-611},
abstract={A simple circuit structure implementing digital-to-analog data conversion function is presented. The proposed digital-to-analog converter utilizes the inherent characters of single-electron tunneling which consist of the periodic voltage oscillation and the ability of counting the number of trapped charges. It produces an analog output voltage for a given digital input. We proposed the device structure performing the weighted summation of inputs, which is converted into an analog voltage by the proposed sensing circuit. Monte Carlo simulation results give us the clear performance of the 3-bit digital-to-analog conversion function and the effect of temperature, capacitance variations, and background charge fluctuations. Moreover, we examined the possibility of extending a N-bit digital-to-analog converter with the proposed scheme.},
keywords={},
doi={},
ISSN={},
month={April},}
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TY - JOUR
TI - A Simple Digital-to-Analog Conversion Technique Using Single-Electron Transistor
T2 - IEICE TRANSACTIONS on Electronics
SP - 608
EP - 611
AU - Su Jin AHN
AU - Dae Mann KIM
PY - 1998
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E81-C
IS - 4
JA - IEICE TRANSACTIONS on Electronics
Y1 - April 1998
AB - A simple circuit structure implementing digital-to-analog data conversion function is presented. The proposed digital-to-analog converter utilizes the inherent characters of single-electron tunneling which consist of the periodic voltage oscillation and the ability of counting the number of trapped charges. It produces an analog output voltage for a given digital input. We proposed the device structure performing the weighted summation of inputs, which is converted into an analog voltage by the proposed sensing circuit. Monte Carlo simulation results give us the clear performance of the 3-bit digital-to-analog conversion function and the effect of temperature, capacitance variations, and background charge fluctuations. Moreover, we examined the possibility of extending a N-bit digital-to-analog converter with the proposed scheme.
ER -