Static Fatigue Reliability of Plastic Split Alignment Sleeve for Single-Mode Optical Connection
Summary :
The static fatigue parameters of plastic sleeves are determined by dynamic fatigue and destructive tests. The failure probability and lifetime of the plastic sleeve are estimated by using these parameters. No failure is expected for 20 years if the plastic sleeve is used in a normal atmosphere (23
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E82-C No.1 pp.66-71
- Publication Date
- 1999/01/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Electromechanical Devices and Their Materials)
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Yoshito SHUTO, Hirotsugu SATO, Shun-ichi TOHNO, "Static Fatigue Reliability of Plastic Split Alignment Sleeve for Single-Mode Optical Connection" in IEICE TRANSACTIONS on Electronics,
vol. E82-C, no. 1, pp. 66-71, January 1999, doi: .
Abstract: The static fatigue parameters of plastic sleeves are determined by dynamic fatigue and destructive tests. The failure probability and lifetime of the plastic sleeve are estimated by using these parameters. No failure is expected for 20 years if the plastic sleeve is used in a normal atmosphere (23
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e82-c_1_66/_p
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@ARTICLE{e82-c_1_66,
author={Yoshito SHUTO, Hirotsugu SATO, Shun-ichi TOHNO, },
journal={IEICE TRANSACTIONS on Electronics},
title={Static Fatigue Reliability of Plastic Split Alignment Sleeve for Single-Mode Optical Connection},
year={1999},
volume={E82-C},
number={1},
pages={66-71},
abstract={The static fatigue parameters of plastic sleeves are determined by dynamic fatigue and destructive tests. The failure probability and lifetime of the plastic sleeve are estimated by using these parameters. No failure is expected for 20 years if the plastic sleeve is used in a normal atmosphere (23
keywords={},
doi={},
ISSN={},
month={January},}
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TY - JOUR
TI - Static Fatigue Reliability of Plastic Split Alignment Sleeve for Single-Mode Optical Connection
T2 - IEICE TRANSACTIONS on Electronics
SP - 66
EP - 71
AU - Yoshito SHUTO
AU - Hirotsugu SATO
AU - Shun-ichi TOHNO
PY - 1999
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E82-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 1999
AB - The static fatigue parameters of plastic sleeves are determined by dynamic fatigue and destructive tests. The failure probability and lifetime of the plastic sleeve are estimated by using these parameters. No failure is expected for 20 years if the plastic sleeve is used in a normal atmosphere (23
ER -
English
