Ribbon-Wire Interconnect Using Parasitic Element

Hajime IZUMI; Hiroyuki ARAI; Tatsuo ITOH

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Hajime IZUMI, Hiroyuki ARAI, Tatsuo ITOH, "Ribbon-Wire Interconnect Using Parasitic Element" in IEICE TRANSACTIONS on Electronics, vol. E82-C, no. 4, pp. 662-664, April 1999, doi: .
Abstract: This paper presents a contact-less connector using proximity coupling through a parasitic element. For example, proximity coupling is used for interconnect of microstrip lines for DC-break structure. We also present a cross wiring structure using this interconnect.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e82-c_4_662/_p

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@ARTICLE{e82-c_4_662,
author={Hajime IZUMI, Hiroyuki ARAI, Tatsuo ITOH, },
journal={IEICE TRANSACTIONS on Electronics},
title={Ribbon-Wire Interconnect Using Parasitic Element},
year={1999},
volume={E82-C},
number={4},
pages={662-664},
abstract={This paper presents a contact-less connector using proximity coupling through a parasitic element. For example, proximity coupling is used for interconnect of microstrip lines for DC-break structure. We also present a cross wiring structure using this interconnect.},
keywords={},
doi={},
ISSN={},
month={April},}

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TY - JOUR
TI - Ribbon-Wire Interconnect Using Parasitic Element
T2 - IEICE TRANSACTIONS on Electronics
SP - 662
EP - 664
AU - Hajime IZUMI
AU - Hiroyuki ARAI
AU - Tatsuo ITOH
PY - 1999
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E82-C
IS - 4
JA - IEICE TRANSACTIONS on Electronics
Y1 - April 1999
AB - This paper presents a contact-less connector using proximity coupling through a parasitic element. For example, proximity coupling is used for interconnect of microstrip lines for DC-break structure. We also present a cross wiring structure using this interconnect.
ER -