Techniques for Widening Lock and Pull-in Ranges and Suppressing Jitter in Clock and Data Recovery ICs--Duplicated Loop Control CDR--
Summary :
This paper describes techniques for widening lock and pull-in ranges and suppressing jitter in clock and data recovery ICs. It is shown theoretically that using a duplicated loop control (DLC)-phase-locked loop (PLL) technique enables wider lock and pull-in ranges in clock and data recovery (CDR) without increasing the cut-off frequency of the jitter transfer function. A 2.5-Gb/s DLC-CDR IC fabricated with a 0.5-µm Si bipolar process provides 2.5 times the lock range and 1.5 times the pull-in range of a conventional CDR IC, and the jitter characteristics of the fabricated CDR IC meet all three STM-16 jitter specifications in ITU-T recommendation G.958.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E84-C No.4 pp.460-469
- Publication Date
- 2001/04/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- PAPER
- Category
- Integrated Electronics
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Keiji KISHINE, Noboru ISHIHARA, Haruhiko ICHINO, "Techniques for Widening Lock and Pull-in Ranges and Suppressing Jitter in Clock and Data Recovery ICs--Duplicated Loop Control CDR--" in IEICE TRANSACTIONS on Electronics,
vol. E84-C, no. 4, pp. 460-469, April 2001, doi: .
Abstract: This paper describes techniques for widening lock and pull-in ranges and suppressing jitter in clock and data recovery ICs. It is shown theoretically that using a duplicated loop control (DLC)-phase-locked loop (PLL) technique enables wider lock and pull-in ranges in clock and data recovery (CDR) without increasing the cut-off frequency of the jitter transfer function. A 2.5-Gb/s DLC-CDR IC fabricated with a 0.5-µm Si bipolar process provides 2.5 times the lock range and 1.5 times the pull-in range of a conventional CDR IC, and the jitter characteristics of the fabricated CDR IC meet all three STM-16 jitter specifications in ITU-T recommendation G.958.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e84-c_4_460/_p
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@ARTICLE{e84-c_4_460,
author={Keiji KISHINE, Noboru ISHIHARA, Haruhiko ICHINO, },
journal={IEICE TRANSACTIONS on Electronics},
title={Techniques for Widening Lock and Pull-in Ranges and Suppressing Jitter in Clock and Data Recovery ICs--Duplicated Loop Control CDR--},
year={2001},
volume={E84-C},
number={4},
pages={460-469},
abstract={This paper describes techniques for widening lock and pull-in ranges and suppressing jitter in clock and data recovery ICs. It is shown theoretically that using a duplicated loop control (DLC)-phase-locked loop (PLL) technique enables wider lock and pull-in ranges in clock and data recovery (CDR) without increasing the cut-off frequency of the jitter transfer function. A 2.5-Gb/s DLC-CDR IC fabricated with a 0.5-µm Si bipolar process provides 2.5 times the lock range and 1.5 times the pull-in range of a conventional CDR IC, and the jitter characteristics of the fabricated CDR IC meet all three STM-16 jitter specifications in ITU-T recommendation G.958.},
keywords={},
doi={},
ISSN={},
month={April},}
Copy
TY - JOUR
TI - Techniques for Widening Lock and Pull-in Ranges and Suppressing Jitter in Clock and Data Recovery ICs--Duplicated Loop Control CDR--
T2 - IEICE TRANSACTIONS on Electronics
SP - 460
EP - 469
AU - Keiji KISHINE
AU - Noboru ISHIHARA
AU - Haruhiko ICHINO
PY - 2001
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E84-C
IS - 4
JA - IEICE TRANSACTIONS on Electronics
Y1 - April 2001
AB - This paper describes techniques for widening lock and pull-in ranges and suppressing jitter in clock and data recovery ICs. It is shown theoretically that using a duplicated loop control (DLC)-phase-locked loop (PLL) technique enables wider lock and pull-in ranges in clock and data recovery (CDR) without increasing the cut-off frequency of the jitter transfer function. A 2.5-Gb/s DLC-CDR IC fabricated with a 0.5-µm Si bipolar process provides 2.5 times the lock range and 1.5 times the pull-in range of a conventional CDR IC, and the jitter characteristics of the fabricated CDR IC meet all three STM-16 jitter specifications in ITU-T recommendation G.958.
ER -
English
