Fidelity of Near-Field Intensity Distribution of Surface Plasmon on Slightly Rough Surfaces
Summary :
Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.
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- IEICE TRANSACTIONS on Electronics Vol.E85-C No.12 pp.2065-2070
- Publication Date
- 2002/12/01
- Publicized
- Online ISSN
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- Type of Manuscript
- Special Section PAPER (Special Issue on Near-Field Optics and Its Applications)
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Tetsuya KAWANISHI, "Fidelity of Near-Field Intensity Distribution of Surface Plasmon on Slightly Rough Surfaces" in IEICE TRANSACTIONS on Electronics,
vol. E85-C, no. 12, pp. 2065-2070, December 2002, doi: .
Abstract: Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e85-c_12_2065/_p
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@ARTICLE{e85-c_12_2065,
author={Tetsuya KAWANISHI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Fidelity of Near-Field Intensity Distribution of Surface Plasmon on Slightly Rough Surfaces},
year={2002},
volume={E85-C},
number={12},
pages={2065-2070},
abstract={Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.},
keywords={},
doi={},
ISSN={},
month={December},}
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TY - JOUR
TI - Fidelity of Near-Field Intensity Distribution of Surface Plasmon on Slightly Rough Surfaces
T2 - IEICE TRANSACTIONS on Electronics
SP - 2065
EP - 2070
AU - Tetsuya KAWANISHI
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E85-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2002
AB - Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.
ER -
English
