Automatic Generation of Compact Electro-Thermal Models for Semiconductor Devices
Summary :
A high power dissipation density in today's miniature electronic/mechanical systems makes on-chip thermal management very important. In order to achieve quick to evaluate, yet accurate electro-thermal models, needed for the thermal management of microsystems, a model order reduction is necessary. In this paper, we present an automatic, Krylov-subspace-based order reduction of a electro-thermal model, which we illustrate by a novel type of micropropulsion device. Numerical simulation results of the full finite element model and the reduced order model, that describes the transient electro-thermal behavior, are presented. A comparison between Krylov-subspace-based order reduction, order reduction using control theoretical approaches and commercially available reduced order modeling has been performed. A Single-Input-Single-Output setup for the Arnoldi reduction algorithm was proved to be sufficient to accurately represent the complete time-dependent temperature distribution of the device.
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- IEICE TRANSACTIONS on Electronics Vol.E86-C No.3 pp.459-465
- Publication Date
- 2003/03/01
- Publicized
- Online ISSN
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- Type of Manuscript
- Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02))
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Tamara BECHTOLD, Evgenii B. RUDNYI, Jan G. KORVINK, "Automatic Generation of Compact Electro-Thermal Models for Semiconductor Devices" in IEICE TRANSACTIONS on Electronics,
vol. E86-C, no. 3, pp. 459-465, March 2003, doi: .
Abstract: A high power dissipation density in today's miniature electronic/mechanical systems makes on-chip thermal management very important. In order to achieve quick to evaluate, yet accurate electro-thermal models, needed for the thermal management of microsystems, a model order reduction is necessary. In this paper, we present an automatic, Krylov-subspace-based order reduction of a electro-thermal model, which we illustrate by a novel type of micropropulsion device. Numerical simulation results of the full finite element model and the reduced order model, that describes the transient electro-thermal behavior, are presented. A comparison between Krylov-subspace-based order reduction, order reduction using control theoretical approaches and commercially available reduced order modeling has been performed. A Single-Input-Single-Output setup for the Arnoldi reduction algorithm was proved to be sufficient to accurately represent the complete time-dependent temperature distribution of the device.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e86-c_3_459/_p
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@ARTICLE{e86-c_3_459,
author={Tamara BECHTOLD, Evgenii B. RUDNYI, Jan G. KORVINK, },
journal={IEICE TRANSACTIONS on Electronics},
title={Automatic Generation of Compact Electro-Thermal Models for Semiconductor Devices},
year={2003},
volume={E86-C},
number={3},
pages={459-465},
abstract={A high power dissipation density in today's miniature electronic/mechanical systems makes on-chip thermal management very important. In order to achieve quick to evaluate, yet accurate electro-thermal models, needed for the thermal management of microsystems, a model order reduction is necessary. In this paper, we present an automatic, Krylov-subspace-based order reduction of a electro-thermal model, which we illustrate by a novel type of micropropulsion device. Numerical simulation results of the full finite element model and the reduced order model, that describes the transient electro-thermal behavior, are presented. A comparison between Krylov-subspace-based order reduction, order reduction using control theoretical approaches and commercially available reduced order modeling has been performed. A Single-Input-Single-Output setup for the Arnoldi reduction algorithm was proved to be sufficient to accurately represent the complete time-dependent temperature distribution of the device.},
keywords={},
doi={},
ISSN={},
month={March},}
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TY - JOUR
TI - Automatic Generation of Compact Electro-Thermal Models for Semiconductor Devices
T2 - IEICE TRANSACTIONS on Electronics
SP - 459
EP - 465
AU - Tamara BECHTOLD
AU - Evgenii B. RUDNYI
AU - Jan G. KORVINK
PY - 2003
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E86-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 2003
AB - A high power dissipation density in today's miniature electronic/mechanical systems makes on-chip thermal management very important. In order to achieve quick to evaluate, yet accurate electro-thermal models, needed for the thermal management of microsystems, a model order reduction is necessary. In this paper, we present an automatic, Krylov-subspace-based order reduction of a electro-thermal model, which we illustrate by a novel type of micropropulsion device. Numerical simulation results of the full finite element model and the reduced order model, that describes the transient electro-thermal behavior, are presented. A comparison between Krylov-subspace-based order reduction, order reduction using control theoretical approaches and commercially available reduced order modeling has been performed. A Single-Input-Single-Output setup for the Arnoldi reduction algorithm was proved to be sufficient to accurately represent the complete time-dependent temperature distribution of the device.
ER -
English
