Spectroscopic Ellipsometry Study of Organic Light Emitting Diode Based on Phosphorescent PtOEP

Taiju TSUBOI; Yoko WASAI; Nataliya NABATOVA-GABAIN

Spectroscopic Ellipsometry Study of Organic Light Emitting Diode Based on Phosphorescent PtOEP

Taiju TSUBOI, Yoko WASAI, Nataliya NABATOVA-GABAIN

Full Text Views

0

Cite this

Summary :

We have determined the thickness and optical constants (refractive index and extinction coefficient) of each layer in the multi-layer organic light emitting diode (OLED) devices based on phosphorescent platinum octaethyl porphine (PtOEP) using a phase modulated spectroscopic ellipsometer. The thickness of each layer estimated from the ellipsometric measurement is different from the thickness measured with quartz oscillator during the evaporation of organic materials. The deviation of total multi-layer thickness is about 5%, while the deviation in each of N, N'-bis(1-naphtyl)-N, N'-diphenyl-1,1'-biphenyl-4,4'-diamine (α-NPD) and aluminum tris 8-hydroxyquinoline (Alq₃) layers is about 20-25%. Additionally the spectra of refractive index and extinction coefficient of Alq₃ and α-NPD layers are different from those that are measured using the single layer films. These results are understood by penetration of organic material from the neighboring layers in the multi-layer structure devices.

Publication: IEICE TRANSACTIONS on Electronics Vol.E87-C No.12 pp.2039-2044

Publication Date: 2004/12/01

Publicized

Online ISSN

DOI

Type of Manuscript: Special Section PAPER (Special Section on Recent Progress in Organic Molecular Electronics)

Category: Characterization and Abilities of Organic Electronic Devices

Cite this

Copy

Taiju TSUBOI, Yoko WASAI, Nataliya NABATOVA-GABAIN, "Spectroscopic Ellipsometry Study of Organic Light Emitting Diode Based on Phosphorescent PtOEP" in IEICE TRANSACTIONS on Electronics, vol. E87-C, no. 12, pp. 2039-2044, December 2004, doi: .
Abstract: We have determined the thickness and optical constants (refractive index and extinction coefficient) of each layer in the multi-layer organic light emitting diode (OLED) devices based on phosphorescent platinum octaethyl porphine (PtOEP) using a phase modulated spectroscopic ellipsometer. The thickness of each layer estimated from the ellipsometric measurement is different from the thickness measured with quartz oscillator during the evaporation of organic materials. The deviation of total multi-layer thickness is about 5%, while the deviation in each of N, N'-bis(1-naphtyl)-N, N'-diphenyl-1,1'-biphenyl-4,4'-diamine (α-NPD) and aluminum tris 8-hydroxyquinoline (Alq₃) layers is about 20-25%. Additionally the spectra of refractive index and extinction coefficient of Alq₃ and α-NPD layers are different from those that are measured using the single layer films. These results are understood by penetration of organic material from the neighboring layers in the multi-layer structure devices.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e87-c_12_2039/_p

Copy

@ARTICLE{e87-c_12_2039,
author={Taiju TSUBOI, Yoko WASAI, Nataliya NABATOVA-GABAIN, },
journal={IEICE TRANSACTIONS on Electronics},
title={Spectroscopic Ellipsometry Study of Organic Light Emitting Diode Based on Phosphorescent PtOEP},
year={2004},
volume={E87-C},
number={12},
pages={2039-2044},
abstract={We have determined the thickness and optical constants (refractive index and extinction coefficient) of each layer in the multi-layer organic light emitting diode (OLED) devices based on phosphorescent platinum octaethyl porphine (PtOEP) using a phase modulated spectroscopic ellipsometer. The thickness of each layer estimated from the ellipsometric measurement is different from the thickness measured with quartz oscillator during the evaporation of organic materials. The deviation of total multi-layer thickness is about 5%, while the deviation in each of N, N'-bis(1-naphtyl)-N, N'-diphenyl-1,1'-biphenyl-4,4'-diamine (α-NPD) and aluminum tris 8-hydroxyquinoline (Alq₃) layers is about 20-25%. Additionally the spectra of refractive index and extinction coefficient of Alq₃ and α-NPD layers are different from those that are measured using the single layer films. These results are understood by penetration of organic material from the neighboring layers in the multi-layer structure devices.},
keywords={},
doi={},
ISSN={},
month={December},}

Copy

TY - JOUR
TI - Spectroscopic Ellipsometry Study of Organic Light Emitting Diode Based on Phosphorescent PtOEP
T2 - IEICE TRANSACTIONS on Electronics
SP - 2039
EP - 2044
AU - Taiju TSUBOI
AU - Yoko WASAI
AU - Nataliya NABATOVA-GABAIN
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E87-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2004
AB - We have determined the thickness and optical constants (refractive index and extinction coefficient) of each layer in the multi-layer organic light emitting diode (OLED) devices based on phosphorescent platinum octaethyl porphine (PtOEP) using a phase modulated spectroscopic ellipsometer. The thickness of each layer estimated from the ellipsometric measurement is different from the thickness measured with quartz oscillator during the evaporation of organic materials. The deviation of total multi-layer thickness is about 5%, while the deviation in each of N, N'-bis(1-naphtyl)-N, N'-diphenyl-1,1'-biphenyl-4,4'-diamine (α-NPD) and aluminum tris 8-hydroxyquinoline (Alq₃) layers is about 20-25%. Additionally the spectra of refractive index and extinction coefficient of Alq₃ and α-NPD layers are different from those that are measured using the single layer films. These results are understood by penetration of organic material from the neighboring layers in the multi-layer structure devices.
ER -