An integrated ambient light sensor (ALS) system in low-temperature polycrystalline silicon (LTPS) thin-film-transistor liquid-crystal-displays (TFT-LCDs) is proposed and prototyped in this study. It is designed as a 4-bit (16-step-grayscale) ALS and includes a noise subtraction circuit, a comparator as an analog-to-digital converter (ADC), 4-bit counters, and a parallel-to-serial converter. LTPS lateral p-i-n diodes with a long i-region are employed as photodetectors in the system. An LSI source driver is mounted on the LCD panel with a sensor control block which provides programmable clocks and reference voltages to the ALS circuit on the glass substrate for sensitivity tuning. The reliability tests were conducted for 300 hours with 30000 lux illumination at 70 °C and at -20 °C. The observed deviations of the ALS values for dark, 1000 lux, and 10000 lux were within ±1.
Takashi NAKAMURA
Japan Display
Masahiro TADA
Japan Display
Hiroyuki KIMURA
Japan Display
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Takashi NAKAMURA, Masahiro TADA, Hiroyuki KIMURA, "An LTPS Ambient Light Sensor System with Sensitivity Correction Methods in LCD" in IEICE TRANSACTIONS on Electronics,
vol. E102-C, no. 7, pp. 558-564, July 2019, doi: 10.1587/transele.2018CTP0004.
Abstract: An integrated ambient light sensor (ALS) system in low-temperature polycrystalline silicon (LTPS) thin-film-transistor liquid-crystal-displays (TFT-LCDs) is proposed and prototyped in this study. It is designed as a 4-bit (16-step-grayscale) ALS and includes a noise subtraction circuit, a comparator as an analog-to-digital converter (ADC), 4-bit counters, and a parallel-to-serial converter. LTPS lateral p-i-n diodes with a long i-region are employed as photodetectors in the system. An LSI source driver is mounted on the LCD panel with a sensor control block which provides programmable clocks and reference voltages to the ALS circuit on the glass substrate for sensitivity tuning. The reliability tests were conducted for 300 hours with 30000 lux illumination at 70 °C and at -20 °C. The observed deviations of the ALS values for dark, 1000 lux, and 10000 lux were within ±1.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.2018CTP0004/_p
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@ARTICLE{e102-c_7_558,
author={Takashi NAKAMURA, Masahiro TADA, Hiroyuki KIMURA, },
journal={IEICE TRANSACTIONS on Electronics},
title={An LTPS Ambient Light Sensor System with Sensitivity Correction Methods in LCD},
year={2019},
volume={E102-C},
number={7},
pages={558-564},
abstract={An integrated ambient light sensor (ALS) system in low-temperature polycrystalline silicon (LTPS) thin-film-transistor liquid-crystal-displays (TFT-LCDs) is proposed and prototyped in this study. It is designed as a 4-bit (16-step-grayscale) ALS and includes a noise subtraction circuit, a comparator as an analog-to-digital converter (ADC), 4-bit counters, and a parallel-to-serial converter. LTPS lateral p-i-n diodes with a long i-region are employed as photodetectors in the system. An LSI source driver is mounted on the LCD panel with a sensor control block which provides programmable clocks and reference voltages to the ALS circuit on the glass substrate for sensitivity tuning. The reliability tests were conducted for 300 hours with 30000 lux illumination at 70 °C and at -20 °C. The observed deviations of the ALS values for dark, 1000 lux, and 10000 lux were within ±1.},
keywords={},
doi={10.1587/transele.2018CTP0004},
ISSN={1745-1353},
month={July},}
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TY - JOUR
TI - An LTPS Ambient Light Sensor System with Sensitivity Correction Methods in LCD
T2 - IEICE TRANSACTIONS on Electronics
SP - 558
EP - 564
AU - Takashi NAKAMURA
AU - Masahiro TADA
AU - Hiroyuki KIMURA
PY - 2019
DO - 10.1587/transele.2018CTP0004
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E102-C
IS - 7
JA - IEICE TRANSACTIONS on Electronics
Y1 - July 2019
AB - An integrated ambient light sensor (ALS) system in low-temperature polycrystalline silicon (LTPS) thin-film-transistor liquid-crystal-displays (TFT-LCDs) is proposed and prototyped in this study. It is designed as a 4-bit (16-step-grayscale) ALS and includes a noise subtraction circuit, a comparator as an analog-to-digital converter (ADC), 4-bit counters, and a parallel-to-serial converter. LTPS lateral p-i-n diodes with a long i-region are employed as photodetectors in the system. An LSI source driver is mounted on the LCD panel with a sensor control block which provides programmable clocks and reference voltages to the ALS circuit on the glass substrate for sensitivity tuning. The reliability tests were conducted for 300 hours with 30000 lux illumination at 70 °C and at -20 °C. The observed deviations of the ALS values for dark, 1000 lux, and 10000 lux were within ±1.
ER -