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Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy-ion and Neutron Irradiation
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- Publication
- IEICE TRANSACTIONS on Electronics Vol.0 No.0 pp.0-0
- Publicized
- 2024/04/10
- DOI
- 10.1587/10.1587/transele.2023ECP5045
- Type of Manuscript
- PAPER
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Jun FURUTA, Shotaro SUGITANI, Ryuichi NAKAJIMA, Takafumi ITO, Kazutoshi KOBAYASHI, "Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy-ion and Neutron Irradiation" in IEICE TRANSACTIONS on Electronics,
vol. , no. 0, pp. 0-0, January , doi: 10.1587/10.1587/transele.2023ECP5045.
Abstract:
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.2023ECP5045/_advpub_f
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@ARTICLE{2023ECP5045,
author={Jun FURUTA, Shotaro SUGITANI, Ryuichi NAKAJIMA, Takafumi ITO, Kazutoshi KOBAYASHI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy-ion and Neutron Irradiation},
year={},
volume={},
number={0},
pages={0-0},
abstract={},
keywords={},
doi={10.1587/10.1587/transele.2023ECP5045},
ISSN={},
month={January},}
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TY - JOUR
TI - Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy-ion and Neutron Irradiation
T2 - IEICE TRANSACTIONS on Electronics
SP - 0
EP - 0
AU - Jun FURUTA
AU - Shotaro SUGITANI
AU - Ryuichi NAKAJIMA
AU - Takafumi ITO
AU - Kazutoshi KOBAYASHI
PY -
DO - 10.1587/10.1587/transele.2023ECP5045
JO - IEICE TRANSACTIONS on Electronics
SN -
VL -
IS - 0
JA - IEICE TRANSACTIONS on Electronics
Y1 - January
AB -
ER -
English
