Radiation-Hardened Flip-Flops in a 65 nm Bulk Process for Terrestrial Applications Coping With Radiation Hardness and Performance Overheads

Copy

Shotaro SUGITANI, Ryuichi NAKAJIMA, Keita YOSHIDA, Jun FURUTA, Kazutoshi KOBAYASHI, "Radiation-Hardened Flip-Flops in a 65 nm Bulk Process for Terrestrial Applications Coping With Radiation Hardness and Performance Overheads" in IEICE TRANSACTIONS on Electronics, vol. , no. 0, pp. 0-0, January , doi: 10.1587/10.1587/transele.2024ECP5016.
Abstract:
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.2024ECP5016/_advpub_f

Copy

@ARTICLE{2024ECP5016,
author={Shotaro SUGITANI, Ryuichi NAKAJIMA, Keita YOSHIDA, Jun FURUTA, Kazutoshi KOBAYASHI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Radiation-Hardened Flip-Flops in a 65 nm Bulk Process for Terrestrial Applications Coping With Radiation Hardness and Performance Overheads},
year={},
volume={},
number={0},
pages={0-0},
abstract={},
keywords={},
doi={10.1587/10.1587/transele.2024ECP5016},
ISSN={},
month={January},}

Copy

TY - JOUR
TI - Radiation-Hardened Flip-Flops in a 65 nm Bulk Process for Terrestrial Applications Coping With Radiation Hardness and Performance Overheads
T2 - IEICE TRANSACTIONS on Electronics
SP - 0
EP - 0
AU - Shotaro SUGITANI
AU - Ryuichi NAKAJIMA
AU - Keita YOSHIDA
AU - Jun FURUTA
AU - Kazutoshi KOBAYASHI
PY -
DO - 10.1587/10.1587/transele.2024ECP5016
JO - IEICE TRANSACTIONS on Electronics
SN -
VL -
IS - 0
JA - IEICE TRANSACTIONS on Electronics
Y1 - January
AB -
ER -