Observation of Tin Plated Fretting Contacts Using FIB-SEM
Summary :
In this report, Focused Ion Beam (FIB) -- SEM technique was applied to observe the tin plated fretting contacts. Spatial distributions of tin, tin oxide and so on have been confirmed quantitatively in two plating thickness of 1 and 5 µm.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E93-C No.9 pp.1452-1455
- Publication Date
- 2010/09/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E93.C.1452
- Type of Manuscript
- BRIEF PAPER
- Category
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Tetsuya ITO, Yoshiyuki NOMURA, Yasuhiro HATTORI, "Observation of Tin Plated Fretting Contacts Using FIB-SEM" in IEICE TRANSACTIONS on Electronics,
vol. E93-C, no. 9, pp. 1452-1455, September 2010, doi: 10.1587/transele.E93.C.1452.
Abstract: In this report, Focused Ion Beam (FIB) -- SEM technique was applied to observe the tin plated fretting contacts. Spatial distributions of tin, tin oxide and so on have been confirmed quantitatively in two plating thickness of 1 and 5 µm.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E93.C.1452/_p
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@ARTICLE{e93-c_9_1452,
author={Tetsuya ITO, Yoshiyuki NOMURA, Yasuhiro HATTORI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Observation of Tin Plated Fretting Contacts Using FIB-SEM},
year={2010},
volume={E93-C},
number={9},
pages={1452-1455},
abstract={In this report, Focused Ion Beam (FIB) -- SEM technique was applied to observe the tin plated fretting contacts. Spatial distributions of tin, tin oxide and so on have been confirmed quantitatively in two plating thickness of 1 and 5 µm.},
keywords={},
doi={10.1587/transele.E93.C.1452},
ISSN={1745-1353},
month={September},}
Copy
TY - JOUR
TI - Observation of Tin Plated Fretting Contacts Using FIB-SEM
T2 - IEICE TRANSACTIONS on Electronics
SP - 1452
EP - 1455
AU - Tetsuya ITO
AU - Yoshiyuki NOMURA
AU - Yasuhiro HATTORI
PY - 2010
DO - 10.1587/transele.E93.C.1452
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E93-C
IS - 9
JA - IEICE TRANSACTIONS on Electronics
Y1 - September 2010
AB - In this report, Focused Ion Beam (FIB) -- SEM technique was applied to observe the tin plated fretting contacts. Spatial distributions of tin, tin oxide and so on have been confirmed quantitatively in two plating thickness of 1 and 5 µm.
ER -
English
