A Single Event Effect Analysis on Static CVSL Exclusive-OR Circuits
Summary :
Single event transient (SET) effects on original static cascade voltage switch logic (CVSL) exclusive-OR (EX-OR) circuits have been investigated using SPICE. SET simulation results have confirmed that the static CVSL EX-OR circuits have increased tolerance to SET. The static CVSL EX-OR circuit is more than 200 times harder than the conventional CMOS circuit.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E93-C No.9 pp.1471-1473
- Publication Date
- 2010/09/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E93.C.1471
- Type of Manuscript
- BRIEF PAPER
- Category
- Semiconductor Materials and Devices
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Hiroshi HATANO, "A Single Event Effect Analysis on Static CVSL Exclusive-OR Circuits" in IEICE TRANSACTIONS on Electronics,
vol. E93-C, no. 9, pp. 1471-1473, September 2010, doi: 10.1587/transele.E93.C.1471.
Abstract: Single event transient (SET) effects on original static cascade voltage switch logic (CVSL) exclusive-OR (EX-OR) circuits have been investigated using SPICE. SET simulation results have confirmed that the static CVSL EX-OR circuits have increased tolerance to SET. The static CVSL EX-OR circuit is more than 200 times harder than the conventional CMOS circuit.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E93.C.1471/_p
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@ARTICLE{e93-c_9_1471,
author={Hiroshi HATANO, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Single Event Effect Analysis on Static CVSL Exclusive-OR Circuits},
year={2010},
volume={E93-C},
number={9},
pages={1471-1473},
abstract={Single event transient (SET) effects on original static cascade voltage switch logic (CVSL) exclusive-OR (EX-OR) circuits have been investigated using SPICE. SET simulation results have confirmed that the static CVSL EX-OR circuits have increased tolerance to SET. The static CVSL EX-OR circuit is more than 200 times harder than the conventional CMOS circuit.},
keywords={},
doi={10.1587/transele.E93.C.1471},
ISSN={1745-1353},
month={September},}
Copy
TY - JOUR
TI - A Single Event Effect Analysis on Static CVSL Exclusive-OR Circuits
T2 - IEICE TRANSACTIONS on Electronics
SP - 1471
EP - 1473
AU - Hiroshi HATANO
PY - 2010
DO - 10.1587/transele.E93.C.1471
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E93-C
IS - 9
JA - IEICE TRANSACTIONS on Electronics
Y1 - September 2010
AB - Single event transient (SET) effects on original static cascade voltage switch logic (CVSL) exclusive-OR (EX-OR) circuits have been investigated using SPICE. SET simulation results have confirmed that the static CVSL EX-OR circuits have increased tolerance to SET. The static CVSL EX-OR circuit is more than 200 times harder than the conventional CMOS circuit.
ER -
English
