Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System
Summary :
LCD Automatic Vision Inspection (AVI) systems automatically detect defect features and measure their sizes via camera vision. AVI systems usually report different measurements on the same defect with some variations on position or rotation mainly because we get different images. This is caused by possible variations in the image acquisition process including optical factors, non-uniform illumination, random noise, and so on. For this reason, conventional area based defect measuring method has some problems in terms of robustness and consistency. In this paper, we propose a new defect size measuring method to overcome these problems. We utilize volume information which is completely ignored in the area based conventional defect measuring method. We choose a bell shape as a defect model for experiment. The results show that our proposed method dramatically improves robustness of defect size measurement. Given proper modeling, the proposed volume based measuring method can be applied to various types of defect for better robustness and consistency.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E93-C No.6 pp.922-928
- Publication Date
- 2010/06/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E93.C.922
- Type of Manuscript
- PAPER
- Category
- Electronic Displays
Authors
Keyword
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Young-Bok JOO, Chan-Ho HAN, Kil-Houm PARK, "Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System" in IEICE TRANSACTIONS on Electronics,
vol. E93-C, no. 6, pp. 922-928, June 2010, doi: 10.1587/transele.E93.C.922.
Abstract: LCD Automatic Vision Inspection (AVI) systems automatically detect defect features and measure their sizes via camera vision. AVI systems usually report different measurements on the same defect with some variations on position or rotation mainly because we get different images. This is caused by possible variations in the image acquisition process including optical factors, non-uniform illumination, random noise, and so on. For this reason, conventional area based defect measuring method has some problems in terms of robustness and consistency. In this paper, we propose a new defect size measuring method to overcome these problems. We utilize volume information which is completely ignored in the area based conventional defect measuring method. We choose a bell shape as a defect model for experiment. The results show that our proposed method dramatically improves robustness of defect size measurement. Given proper modeling, the proposed volume based measuring method can be applied to various types of defect for better robustness and consistency.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E93.C.922/_p
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@ARTICLE{e93-c_6_922,
author={Young-Bok JOO, Chan-Ho HAN, Kil-Houm PARK, },
journal={IEICE TRANSACTIONS on Electronics},
title={Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System},
year={2010},
volume={E93-C},
number={6},
pages={922-928},
abstract={LCD Automatic Vision Inspection (AVI) systems automatically detect defect features and measure their sizes via camera vision. AVI systems usually report different measurements on the same defect with some variations on position or rotation mainly because we get different images. This is caused by possible variations in the image acquisition process including optical factors, non-uniform illumination, random noise, and so on. For this reason, conventional area based defect measuring method has some problems in terms of robustness and consistency. In this paper, we propose a new defect size measuring method to overcome these problems. We utilize volume information which is completely ignored in the area based conventional defect measuring method. We choose a bell shape as a defect model for experiment. The results show that our proposed method dramatically improves robustness of defect size measurement. Given proper modeling, the proposed volume based measuring method can be applied to various types of defect for better robustness and consistency.},
keywords={},
doi={10.1587/transele.E93.C.922},
ISSN={1745-1353},
month={June},}
Copy
TY - JOUR
TI - Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System
T2 - IEICE TRANSACTIONS on Electronics
SP - 922
EP - 928
AU - Young-Bok JOO
AU - Chan-Ho HAN
AU - Kil-Houm PARK
PY - 2010
DO - 10.1587/transele.E93.C.922
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E93-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2010
AB - LCD Automatic Vision Inspection (AVI) systems automatically detect defect features and measure their sizes via camera vision. AVI systems usually report different measurements on the same defect with some variations on position or rotation mainly because we get different images. This is caused by possible variations in the image acquisition process including optical factors, non-uniform illumination, random noise, and so on. For this reason, conventional area based defect measuring method has some problems in terms of robustness and consistency. In this paper, we propose a new defect size measuring method to overcome these problems. We utilize volume information which is completely ignored in the area based conventional defect measuring method. We choose a bell shape as a defect model for experiment. The results show that our proposed method dramatically improves robustness of defect size measurement. Given proper modeling, the proposed volume based measuring method can be applied to various types of defect for better robustness and consistency.
ER -
English
