A detailed analysis of a multilayer symmetric coupler employing symmetrical broad-side coupled lines is presented. We confirm that the coupler can be designed using a well-known even-odd mode analysis of two strip lines while the coupler has four strip lines. We also confirm that the previously reported poor isolation originates from port mismatching. To verify the analysis, couplers that have different dimensions are fabricated. One example exhibits a coupling loss of 4.5
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Hiroshi OKAZAKI, Kiyomichi ARAKI, "Detailed Analysis of Multilayer Broad-Side Coupler with a Symmetric Structure" in IEICE TRANSACTIONS on Electronics,
vol. E94-C, no. 8, pp. 1253-1261, August 2011, doi: 10.1587/transele.E94.C.1253.
Abstract: A detailed analysis of a multilayer symmetric coupler employing symmetrical broad-side coupled lines is presented. We confirm that the coupler can be designed using a well-known even-odd mode analysis of two strip lines while the coupler has four strip lines. We also confirm that the previously reported poor isolation originates from port mismatching. To verify the analysis, couplers that have different dimensions are fabricated. One example exhibits a coupling loss of 4.5
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E94.C.1253/_p
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@ARTICLE{e94-c_8_1253,
author={Hiroshi OKAZAKI, Kiyomichi ARAKI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Detailed Analysis of Multilayer Broad-Side Coupler with a Symmetric Structure},
year={2011},
volume={E94-C},
number={8},
pages={1253-1261},
abstract={A detailed analysis of a multilayer symmetric coupler employing symmetrical broad-side coupled lines is presented. We confirm that the coupler can be designed using a well-known even-odd mode analysis of two strip lines while the coupler has four strip lines. We also confirm that the previously reported poor isolation originates from port mismatching. To verify the analysis, couplers that have different dimensions are fabricated. One example exhibits a coupling loss of 4.5
keywords={},
doi={10.1587/transele.E94.C.1253},
ISSN={1745-1353},
month={August},}
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TY - JOUR
TI - Detailed Analysis of Multilayer Broad-Side Coupler with a Symmetric Structure
T2 - IEICE TRANSACTIONS on Electronics
SP - 1253
EP - 1261
AU - Hiroshi OKAZAKI
AU - Kiyomichi ARAKI
PY - 2011
DO - 10.1587/transele.E94.C.1253
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E94-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 2011
AB - A detailed analysis of a multilayer symmetric coupler employing symmetrical broad-side coupled lines is presented. We confirm that the coupler can be designed using a well-known even-odd mode analysis of two strip lines while the coupler has four strip lines. We also confirm that the previously reported poor isolation originates from port mismatching. To verify the analysis, couplers that have different dimensions are fabricated. One example exhibits a coupling loss of 4.5
ER -