IEICE TRANSACTIONS on Electronics
Observations of Structural Transition of Tin Plated Fretting Contacts Using FIB-SEM
Summary :
In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and so on. With this demand, contact failure caused by the fretting corrosion seems to become a serious problem in the future. In this report, three-dimensional observations using Focused Ion Beam (FIB)-SEM method have been made for tin plated fretting contacts before and after the contact resistance increase with tin plating thickness 5 µm. With these observations, the three dimensional structural transition from tin to tin oxide have been examined.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E94-C No.9 pp.1350-1355
- Publication Date
- 2011/09/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E94.C.1350
- Type of Manuscript
- Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices – Papers selected from International Session on Electro-Mechanical Devices (IS-EMD2010) and other research results –)
- Category
Authors
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Tetsuya ITO, Shigeru OGIHARA, Yasuhiro HATTORI, "Observations of Structural Transition of Tin Plated Fretting Contacts Using FIB-SEM" in IEICE TRANSACTIONS on Electronics,
vol. E94-C, no. 9, pp. 1350-1355, September 2011, doi: 10.1587/transele.E94.C.1350.
Abstract: In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and so on. With this demand, contact failure caused by the fretting corrosion seems to become a serious problem in the future. In this report, three-dimensional observations using Focused Ion Beam (FIB)-SEM method have been made for tin plated fretting contacts before and after the contact resistance increase with tin plating thickness 5 µm. With these observations, the three dimensional structural transition from tin to tin oxide have been examined.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E94.C.1350/_p
Copy
@ARTICLE{e94-c_9_1350,
author={Tetsuya ITO, Shigeru OGIHARA, Yasuhiro HATTORI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Observations of Structural Transition of Tin Plated Fretting Contacts Using FIB-SEM},
year={2011},
volume={E94-C},
number={9},
pages={1350-1355},
abstract={In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and so on. With this demand, contact failure caused by the fretting corrosion seems to become a serious problem in the future. In this report, three-dimensional observations using Focused Ion Beam (FIB)-SEM method have been made for tin plated fretting contacts before and after the contact resistance increase with tin plating thickness 5 µm. With these observations, the three dimensional structural transition from tin to tin oxide have been examined.},
keywords={},
doi={10.1587/transele.E94.C.1350},
ISSN={1745-1353},
month={September},}
Copy
TY - JOUR
TI - Observations of Structural Transition of Tin Plated Fretting Contacts Using FIB-SEM
T2 - IEICE TRANSACTIONS on Electronics
SP - 1350
EP - 1355
AU - Tetsuya ITO
AU - Shigeru OGIHARA
AU - Yasuhiro HATTORI
PY - 2011
DO - 10.1587/transele.E94.C.1350
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E94-C
IS - 9
JA - IEICE TRANSACTIONS on Electronics
Y1 - September 2011
AB - In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and so on. With this demand, contact failure caused by the fretting corrosion seems to become a serious problem in the future. In this report, three-dimensional observations using Focused Ion Beam (FIB)-SEM method have been made for tin plated fretting contacts before and after the contact resistance increase with tin plating thickness 5 µm. With these observations, the three dimensional structural transition from tin to tin oxide have been examined.
ER -
English
