IEICE TRANSACTIONS on Electronics
Contact Conditions in Connectors that Cause Common Mode Radiation
Summary :
When contact failure occurs in a connector in a coaxial high-frequency (HF) signal transmission line, it is well known that common-mode (CM) radiation occurs on the line. We focus on contact conditions in a connector causing such CM radiation. Experiments and simulations verify that CM radiation increases as the contact resistance increases. While the CM current strongly depends on the distribution pattern of contact resistances at a low resistance, the CM current does not depend on these pattern at a high resistance. Our results indicate that it is important to maintain a symmetrical distribution of contact spots whenever the number of such spots is four or more.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E94-C No.9 pp.1369-1374
- Publication Date
- 2011/09/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E94.C.1369
- Type of Manuscript
- Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices – Papers selected from International Session on Electro-Mechanical Devices (IS-EMD2010) and other research results –)
- Category
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Yu-ichi HAYASHI, Yoshiki KAYANO, Takaaki MIZUKI, Hideaki SONE, Hiroshi INOUE, "Contact Conditions in Connectors that Cause Common Mode Radiation" in IEICE TRANSACTIONS on Electronics,
vol. E94-C, no. 9, pp. 1369-1374, September 2011, doi: 10.1587/transele.E94.C.1369.
Abstract: When contact failure occurs in a connector in a coaxial high-frequency (HF) signal transmission line, it is well known that common-mode (CM) radiation occurs on the line. We focus on contact conditions in a connector causing such CM radiation. Experiments and simulations verify that CM radiation increases as the contact resistance increases. While the CM current strongly depends on the distribution pattern of contact resistances at a low resistance, the CM current does not depend on these pattern at a high resistance. Our results indicate that it is important to maintain a symmetrical distribution of contact spots whenever the number of such spots is four or more.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E94.C.1369/_p
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@ARTICLE{e94-c_9_1369,
author={Yu-ichi HAYASHI, Yoshiki KAYANO, Takaaki MIZUKI, Hideaki SONE, Hiroshi INOUE, },
journal={IEICE TRANSACTIONS on Electronics},
title={Contact Conditions in Connectors that Cause Common Mode Radiation},
year={2011},
volume={E94-C},
number={9},
pages={1369-1374},
abstract={When contact failure occurs in a connector in a coaxial high-frequency (HF) signal transmission line, it is well known that common-mode (CM) radiation occurs on the line. We focus on contact conditions in a connector causing such CM radiation. Experiments and simulations verify that CM radiation increases as the contact resistance increases. While the CM current strongly depends on the distribution pattern of contact resistances at a low resistance, the CM current does not depend on these pattern at a high resistance. Our results indicate that it is important to maintain a symmetrical distribution of contact spots whenever the number of such spots is four or more.},
keywords={},
doi={10.1587/transele.E94.C.1369},
ISSN={1745-1353},
month={September},}
Copy
TY - JOUR
TI - Contact Conditions in Connectors that Cause Common Mode Radiation
T2 - IEICE TRANSACTIONS on Electronics
SP - 1369
EP - 1374
AU - Yu-ichi HAYASHI
AU - Yoshiki KAYANO
AU - Takaaki MIZUKI
AU - Hideaki SONE
AU - Hiroshi INOUE
PY - 2011
DO - 10.1587/transele.E94.C.1369
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E94-C
IS - 9
JA - IEICE TRANSACTIONS on Electronics
Y1 - September 2011
AB - When contact failure occurs in a connector in a coaxial high-frequency (HF) signal transmission line, it is well known that common-mode (CM) radiation occurs on the line. We focus on contact conditions in a connector causing such CM radiation. Experiments and simulations verify that CM radiation increases as the contact resistance increases. While the CM current strongly depends on the distribution pattern of contact resistances at a low resistance, the CM current does not depend on these pattern at a high resistance. Our results indicate that it is important to maintain a symmetrical distribution of contact spots whenever the number of such spots is four or more.
ER -
English
