The search functionality is under construction.
The search functionality is under construction.

A 50 ns Verify Speed in Resistive Random Access Memory by Using a Write Resistance Tracking Circuit

Shyh-Shyuan SHEU, Kuo-Hsing CHENG, Yu-Sheng CHEN, Pang-Shiu CHEN, Ming-Jinn TSAI, Yu-Lung LO

  • Full Text Views

    0

  • Cite this

Summary :

This paper proposes a write resistance tracking circuit (WRTC) to improve the memory window of HfOx-based resistive memory. With a 50-ns single voltage pulse, the minimal resistance of the high resistance state in the 1-kb array of resistive switching elements can increase from 25 kΩ to 65 kΩ by using the proposed verify circuit. The WRTC uses the transition current detection method based on the feedback of the memory cell to control the write driver. The WRTC achieves distinct bistable resistance states, avoids the occurrence of over-RESET, and enhances the memory window of the RRAM cell.

Publication
IEICE TRANSACTIONS on Electronics Vol.E95-C No.6 pp.1128-1131
Publication Date
2012/06/01
Publicized
Online ISSN
1745-1353
DOI
10.1587/transele.E95.C.1128
Type of Manuscript
BRIEF PAPER
Category
Integrated Electronics

Authors

Keyword