Open Access
Introduction to Latest RF ATE with Low Test Cost Solutions
-
Full Text Views
51
- Cite this
- Free PDF (4.8MB)
Summary :
This paper describes latest RF Automated Test Equipment (RF ATE) technologies that include device under test (DUT) connections, a calibration method, and an RF test module mainly focusing on low cost of test (COT). Most important respect for low COT is how achieve a number of simultaneous measurements and short test time as well as a plain calibration. We realized these respects by a newly proposed calibration method and a drastically downsized RF test module with multiple resources and high throughput. The calibration method is very convenient for RF ATE. Major contribution for downsizing of the RF test module is RF circuit technology in form of RF functional system in package (RF-SIPs), resulting in very attractive test solutions.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E95-C No.7 pp.1147-1153
- Publication Date
- 2012/07/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E95.C.1147
- Type of Manuscript
- Special Section INVITED PAPER (Special Section on Recent Trends of Microwave Systems and Their Fundamental Technologies)
- Category
Authors
Keyword
ATE, SoC tester, SIP, calibration, LTCC, MMIC
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Masayuki KIMISHIMA, "Introduction to Latest RF ATE with Low Test Cost Solutions" in IEICE TRANSACTIONS on Electronics,
vol. E95-C, no. 7, pp. 1147-1153, July 2012, doi: 10.1587/transele.E95.C.1147.
Abstract: This paper describes latest RF Automated Test Equipment (RF ATE) technologies that include device under test (DUT) connections, a calibration method, and an RF test module mainly focusing on low cost of test (COT). Most important respect for low COT is how achieve a number of simultaneous measurements and short test time as well as a plain calibration. We realized these respects by a newly proposed calibration method and a drastically downsized RF test module with multiple resources and high throughput. The calibration method is very convenient for RF ATE. Major contribution for downsizing of the RF test module is RF circuit technology in form of RF functional system in package (RF-SIPs), resulting in very attractive test solutions.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E95.C.1147/_p
Copy
@ARTICLE{e95-c_7_1147,
author={Masayuki KIMISHIMA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Introduction to Latest RF ATE with Low Test Cost Solutions},
year={2012},
volume={E95-C},
number={7},
pages={1147-1153},
abstract={This paper describes latest RF Automated Test Equipment (RF ATE) technologies that include device under test (DUT) connections, a calibration method, and an RF test module mainly focusing on low cost of test (COT). Most important respect for low COT is how achieve a number of simultaneous measurements and short test time as well as a plain calibration. We realized these respects by a newly proposed calibration method and a drastically downsized RF test module with multiple resources and high throughput. The calibration method is very convenient for RF ATE. Major contribution for downsizing of the RF test module is RF circuit technology in form of RF functional system in package (RF-SIPs), resulting in very attractive test solutions.},
keywords={},
doi={10.1587/transele.E95.C.1147},
ISSN={1745-1353},
month={July},}
Copy
TY - JOUR
TI - Introduction to Latest RF ATE with Low Test Cost Solutions
T2 - IEICE TRANSACTIONS on Electronics
SP - 1147
EP - 1153
AU - Masayuki KIMISHIMA
PY - 2012
DO - 10.1587/transele.E95.C.1147
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E95-C
IS - 7
JA - IEICE TRANSACTIONS on Electronics
Y1 - July 2012
AB - This paper describes latest RF Automated Test Equipment (RF ATE) technologies that include device under test (DUT) connections, a calibration method, and an RF test module mainly focusing on low cost of test (COT). Most important respect for low COT is how achieve a number of simultaneous measurements and short test time as well as a plain calibration. We realized these respects by a newly proposed calibration method and a drastically downsized RF test module with multiple resources and high throughput. The calibration method is very convenient for RF ATE. Major contribution for downsizing of the RF test module is RF circuit technology in form of RF functional system in package (RF-SIPs), resulting in very attractive test solutions.
ER -
English
