Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns
Summary :
A diagnosis technique is presented to locate at least one fault in a scan chain with multiple timing faults. This diagnosis technique applies Single Excitation (SE) patterns of which only one bit can be flipped even in the presence of multiple faults. By applying the SE patterns, the problem of simulations with unknown values is eliminated. The diagnosis result is therefore deterministic, not probabilistic. Experiments on the ISCAS benchmark circuits show that the average diagnosis resolution is less than ten scan cells.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E88-A No.4 pp.1024-1030
- Publication Date
- 2005/04/01
- Publicized
- Online ISSN
- DOI
- 10.1093/ietfec/e88-a.4.1024
- Type of Manuscript
- PAPER
- Category
- VLSI Design Technology and CAD
Authors
Keyword
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James Chien-Mo LI, "Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns" in IEICE TRANSACTIONS on Fundamentals,
vol. E88-A, no. 4, pp. 1024-1030, April 2005, doi: 10.1093/ietfec/e88-a.4.1024.
Abstract: A diagnosis technique is presented to locate at least one fault in a scan chain with multiple timing faults. This diagnosis technique applies Single Excitation (SE) patterns of which only one bit can be flipped even in the presence of multiple faults. By applying the SE patterns, the problem of simulations with unknown values is eliminated. The diagnosis result is therefore deterministic, not probabilistic. Experiments on the ISCAS benchmark circuits show that the average diagnosis resolution is less than ten scan cells.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1093/ietfec/e88-a.4.1024/_p
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@ARTICLE{e88-a_4_1024,
author={James Chien-Mo LI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns},
year={2005},
volume={E88-A},
number={4},
pages={1024-1030},
abstract={A diagnosis technique is presented to locate at least one fault in a scan chain with multiple timing faults. This diagnosis technique applies Single Excitation (SE) patterns of which only one bit can be flipped even in the presence of multiple faults. By applying the SE patterns, the problem of simulations with unknown values is eliminated. The diagnosis result is therefore deterministic, not probabilistic. Experiments on the ISCAS benchmark circuits show that the average diagnosis resolution is less than ten scan cells.},
keywords={},
doi={10.1093/ietfec/e88-a.4.1024},
ISSN={},
month={April},}
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TY - JOUR
TI - Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1024
EP - 1030
AU - James Chien-Mo LI
PY - 2005
DO - 10.1093/ietfec/e88-a.4.1024
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E88-A
IS - 4
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - April 2005
AB - A diagnosis technique is presented to locate at least one fault in a scan chain with multiple timing faults. This diagnosis technique applies Single Excitation (SE) patterns of which only one bit can be flipped even in the presence of multiple faults. By applying the SE patterns, the problem of simulations with unknown values is eliminated. The diagnosis result is therefore deterministic, not probabilistic. Experiments on the ISCAS benchmark circuits show that the average diagnosis resolution is less than ten scan cells.
ER -
English
