Background-Adjusted Weber-Fechner Fraction Considering Crispening Effect
Summary :
The recognition limit of luminance difference in the human visual system (HVS) has not been studied systematically. In this paper, surround adapted Weber-Fechner fraction is calculated based on the crispening effect. It is found that surround adapted fractions have reduced to 1/3 of the traditional Weber-Fechner fractions. As compared with Breitmeyer's experiments, the presented result is a reasonable one. It can be used as some guide to design the digital display system when a designer needs to decide bit count of digital signal in considering of the limit of brightness level, and as the inspection tool of display manufacturing of brightness smear, defect, and so on.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E88-A No.6 pp.1529-1532
- Publication Date
- 2005/06/01
- Publicized
- Online ISSN
- DOI
- 10.1093/ietfec/e88-a.6.1529
- Type of Manuscript
- Special Section LETTER (Special Section on Papers Selected from 2004 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2004))
- Category
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Dong-Ha LEE, Chan-Ho HAN, Kyu-Ik SOHNG, "Background-Adjusted Weber-Fechner Fraction Considering Crispening Effect" in IEICE TRANSACTIONS on Fundamentals,
vol. E88-A, no. 6, pp. 1529-1532, June 2005, doi: 10.1093/ietfec/e88-a.6.1529.
Abstract: The recognition limit of luminance difference in the human visual system (HVS) has not been studied systematically. In this paper, surround adapted Weber-Fechner fraction is calculated based on the crispening effect. It is found that surround adapted fractions have reduced to 1/3 of the traditional Weber-Fechner fractions. As compared with Breitmeyer's experiments, the presented result is a reasonable one. It can be used as some guide to design the digital display system when a designer needs to decide bit count of digital signal in considering of the limit of brightness level, and as the inspection tool of display manufacturing of brightness smear, defect, and so on.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1093/ietfec/e88-a.6.1529/_p
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@ARTICLE{e88-a_6_1529,
author={Dong-Ha LEE, Chan-Ho HAN, Kyu-Ik SOHNG, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Background-Adjusted Weber-Fechner Fraction Considering Crispening Effect},
year={2005},
volume={E88-A},
number={6},
pages={1529-1532},
abstract={The recognition limit of luminance difference in the human visual system (HVS) has not been studied systematically. In this paper, surround adapted Weber-Fechner fraction is calculated based on the crispening effect. It is found that surround adapted fractions have reduced to 1/3 of the traditional Weber-Fechner fractions. As compared with Breitmeyer's experiments, the presented result is a reasonable one. It can be used as some guide to design the digital display system when a designer needs to decide bit count of digital signal in considering of the limit of brightness level, and as the inspection tool of display manufacturing of brightness smear, defect, and so on.},
keywords={},
doi={10.1093/ietfec/e88-a.6.1529},
ISSN={},
month={June},}
Copy
TY - JOUR
TI - Background-Adjusted Weber-Fechner Fraction Considering Crispening Effect
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1529
EP - 1532
AU - Dong-Ha LEE
AU - Chan-Ho HAN
AU - Kyu-Ik SOHNG
PY - 2005
DO - 10.1093/ietfec/e88-a.6.1529
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E88-A
IS - 6
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - June 2005
AB - The recognition limit of luminance difference in the human visual system (HVS) has not been studied systematically. In this paper, surround adapted Weber-Fechner fraction is calculated based on the crispening effect. It is found that surround adapted fractions have reduced to 1/3 of the traditional Weber-Fechner fractions. As compared with Breitmeyer's experiments, the presented result is a reasonable one. It can be used as some guide to design the digital display system when a designer needs to decide bit count of digital signal in considering of the limit of brightness level, and as the inspection tool of display manufacturing of brightness smear, defect, and so on.
ER -
English
