One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In MTCMOS circuit, voltage on virtual ground fluctuates due to a discharge current of a logic cell. This event affects to the cell delay and makes static timing analysis (STA) difficult. In this paper, we propose a delay modeling and static STA methodology targeting at MTCMOS circuits. In the proposed method, we prepare a delay look-up table (LUT) consisting of the input slew, the output load capacitance, the virtual ground length, and a power-switch size. Using this LUT, we compute a circuit delay for each logic cell by applying the linear interpolation. This technique enables to calculate the cell delay considering the delay increase by the voltage fluctuation of virtual ground line. Experimental results show that the proposed methodology enables to estimate the cell delay and the critical path delay within 8% errors compared with SPICE simulation.
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Naoaki OHKUBO, Kimiyoshi USAMI, "Delay Modeling and Critical-Path Delay Calculation for MTCMOS Circuits" in IEICE TRANSACTIONS on Fundamentals,
vol. E89-A, no. 12, pp. 3482-3490, December 2006, doi: 10.1093/ietfec/e89-a.12.3482.
Abstract: One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In MTCMOS circuit, voltage on virtual ground fluctuates due to a discharge current of a logic cell. This event affects to the cell delay and makes static timing analysis (STA) difficult. In this paper, we propose a delay modeling and static STA methodology targeting at MTCMOS circuits. In the proposed method, we prepare a delay look-up table (LUT) consisting of the input slew, the output load capacitance, the virtual ground length, and a power-switch size. Using this LUT, we compute a circuit delay for each logic cell by applying the linear interpolation. This technique enables to calculate the cell delay considering the delay increase by the voltage fluctuation of virtual ground line. Experimental results show that the proposed methodology enables to estimate the cell delay and the critical path delay within 8% errors compared with SPICE simulation.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1093/ietfec/e89-a.12.3482/_p
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@ARTICLE{e89-a_12_3482,
author={Naoaki OHKUBO, Kimiyoshi USAMI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Delay Modeling and Critical-Path Delay Calculation for MTCMOS Circuits},
year={2006},
volume={E89-A},
number={12},
pages={3482-3490},
abstract={One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In MTCMOS circuit, voltage on virtual ground fluctuates due to a discharge current of a logic cell. This event affects to the cell delay and makes static timing analysis (STA) difficult. In this paper, we propose a delay modeling and static STA methodology targeting at MTCMOS circuits. In the proposed method, we prepare a delay look-up table (LUT) consisting of the input slew, the output load capacitance, the virtual ground length, and a power-switch size. Using this LUT, we compute a circuit delay for each logic cell by applying the linear interpolation. This technique enables to calculate the cell delay considering the delay increase by the voltage fluctuation of virtual ground line. Experimental results show that the proposed methodology enables to estimate the cell delay and the critical path delay within 8% errors compared with SPICE simulation.},
keywords={},
doi={10.1093/ietfec/e89-a.12.3482},
ISSN={1745-1337},
month={December},}
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TY - JOUR
TI - Delay Modeling and Critical-Path Delay Calculation for MTCMOS Circuits
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 3482
EP - 3490
AU - Naoaki OHKUBO
AU - Kimiyoshi USAMI
PY - 2006
DO - 10.1093/ietfec/e89-a.12.3482
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E89-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2006
AB - One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In MTCMOS circuit, voltage on virtual ground fluctuates due to a discharge current of a logic cell. This event affects to the cell delay and makes static timing analysis (STA) difficult. In this paper, we propose a delay modeling and static STA methodology targeting at MTCMOS circuits. In the proposed method, we prepare a delay look-up table (LUT) consisting of the input slew, the output load capacitance, the virtual ground length, and a power-switch size. Using this LUT, we compute a circuit delay for each logic cell by applying the linear interpolation. This technique enables to calculate the cell delay considering the delay increase by the voltage fluctuation of virtual ground line. Experimental results show that the proposed methodology enables to estimate the cell delay and the critical path delay within 8% errors compared with SPICE simulation.
ER -