A Switched-Capacitor Capacitance Measurement Circuit with the Vernier Scale
Summary :
To improve measurement accuracy and speed, a switched-capacitor capacitance measurement circuit with the vernier scale is developed. Its process consists of a coarse measurement by charge-balancing A-D conversion and a fine measurement by single-slope A-D conversion. a prototype using discrete components confirms the principles of operation.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E76-A No.7 pp.1139-1142
- Publication Date
- 1993/07/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section LETTER (Special Section of Letters Selected from the 1993 IEICE Spring Conference)
- Category
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Kazuyuki KONDO, Kenzo WATANABE, "A Switched-Capacitor Capacitance Measurement Circuit with the Vernier Scale" in IEICE TRANSACTIONS on Fundamentals,
vol. E76-A, no. 7, pp. 1139-1142, July 1993, doi: .
Abstract: To improve measurement accuracy and speed, a switched-capacitor capacitance measurement circuit with the vernier scale is developed. Its process consists of a coarse measurement by charge-balancing A-D conversion and a fine measurement by single-slope A-D conversion. a prototype using discrete components confirms the principles of operation.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e76-a_7_1139/_p
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@ARTICLE{e76-a_7_1139,
author={Kazuyuki KONDO, Kenzo WATANABE, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A Switched-Capacitor Capacitance Measurement Circuit with the Vernier Scale},
year={1993},
volume={E76-A},
number={7},
pages={1139-1142},
abstract={To improve measurement accuracy and speed, a switched-capacitor capacitance measurement circuit with the vernier scale is developed. Its process consists of a coarse measurement by charge-balancing A-D conversion and a fine measurement by single-slope A-D conversion. a prototype using discrete components confirms the principles of operation.},
keywords={},
doi={},
ISSN={},
month={July},}
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TY - JOUR
TI - A Switched-Capacitor Capacitance Measurement Circuit with the Vernier Scale
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1139
EP - 1142
AU - Kazuyuki KONDO
AU - Kenzo WATANABE
PY - 1993
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E76-A
IS - 7
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - July 1993
AB - To improve measurement accuracy and speed, a switched-capacitor capacitance measurement circuit with the vernier scale is developed. Its process consists of a coarse measurement by charge-balancing A-D conversion and a fine measurement by single-slope A-D conversion. a prototype using discrete components confirms the principles of operation.
ER -
English
