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Eiji FUJIWARA, Mitsuru HAMADA, "Single b-Bit Byte Error Correcting and Double Bit Error Detecting Codes for High-Speed Memory Systems" in IEICE TRANSACTIONS on Fundamentals,
vol. E76-A, no. 9, pp. 1442-1448, September 1993, doi: .
Abstract: This paper proposes new design methods for single b-bit (b2) byte error correcting and double bit error detecting code, called SbEC-DED code, suitable for high-speed memory systems using byte organized RAM chips. This new type of byte error control code is practical from the viewpoint of having less redundancy and stronger error control capability than the existing ones. A code design method using elements from a coset of subfield under addition gives the practical SbEC-DED code with 64 information bits and 4-bit byte length which has the same check-bit length, 12 bits, as that of the Hamming single byte error correcting code. This also has very high error detection capabilities of random double byte errors and of random triple bit errors.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e76-a_9_1442/_p
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@ARTICLE{e76-a_9_1442,
author={Eiji FUJIWARA, Mitsuru HAMADA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Single b-Bit Byte Error Correcting and Double Bit Error Detecting Codes for High-Speed Memory Systems},
year={1993},
volume={E76-A},
number={9},
pages={1442-1448},
abstract={This paper proposes new design methods for single b-bit (b2) byte error correcting and double bit error detecting code, called SbEC-DED code, suitable for high-speed memory systems using byte organized RAM chips. This new type of byte error control code is practical from the viewpoint of having less redundancy and stronger error control capability than the existing ones. A code design method using elements from a coset of subfield under addition gives the practical SbEC-DED code with 64 information bits and 4-bit byte length which has the same check-bit length, 12 bits, as that of the Hamming single byte error correcting code. This also has very high error detection capabilities of random double byte errors and of random triple bit errors.},
keywords={},
doi={},
ISSN={},
month={September},}
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TY - JOUR
TI - Single b-Bit Byte Error Correcting and Double Bit Error Detecting Codes for High-Speed Memory Systems
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1442
EP - 1448
AU - Eiji FUJIWARA
AU - Mitsuru HAMADA
PY - 1993
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E76-A
IS - 9
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - September 1993
AB - This paper proposes new design methods for single b-bit (b2) byte error correcting and double bit error detecting code, called SbEC-DED code, suitable for high-speed memory systems using byte organized RAM chips. This new type of byte error control code is practical from the viewpoint of having less redundancy and stronger error control capability than the existing ones. A code design method using elements from a coset of subfield under addition gives the practical SbEC-DED code with 64 information bits and 4-bit byte length which has the same check-bit length, 12 bits, as that of the Hamming single byte error correcting code. This also has very high error detection capabilities of random double byte errors and of random triple bit errors.
ER -