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Parallel Test Structure in Latch Based Asynchronous Pipeline

Jing-ling YANG, Chiu-sing CHOY, Cheong-Fat CHAN

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Summary :

Detecting the stuck-at-pass faults in the event-driven latches is the main difficult in testing latch based asynchronous pipeline. In this paper we proposed a parallel test structure to ease this problem.

Publication
IEICE TRANSACTIONS on Fundamentals Vol.E82-A No.11 pp.2527-2529
Publication Date
1999/11/25
Publicized
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Type of Manuscript
Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
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