DC offset causes performance degradation in signal processing systems especially for high-speed applications. A new offset cancellation method that relaxes the requirement for the offset of the circuit components in the differential analog data path to about 10 times larger is introduced. This method moves the adjusting target from analog-to-digital converter (ADC) to its input buffer and adjusts DC level of ADC input to its center before the final offset cancellation. It eliminates post-production adjustment such as fuse trimming, which increases the cost and TAT in manufacturing and testing. Execution and simulation times are shortened down to 1/9 for less settling time in buffer and with improved logic. An automatic quick offset calibration circuit is implemented in a small silicon space in a high-speed hard disk drive (HDD) channel with 0.25-µm four-layer metal CMOS process. The measured data show this method works effectively in this system.
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Takeo YASUDA, Hajime ANDOH, "Differential Analog Data Path DC Offset Calibration Methods" in IEICE TRANSACTIONS on Fundamentals,
vol. E82-A, no. 2, pp. 301-306, February 1999, doi: .
Abstract: DC offset causes performance degradation in signal processing systems especially for high-speed applications. A new offset cancellation method that relaxes the requirement for the offset of the circuit components in the differential analog data path to about 10 times larger is introduced. This method moves the adjusting target from analog-to-digital converter (ADC) to its input buffer and adjusts DC level of ADC input to its center before the final offset cancellation. It eliminates post-production adjustment such as fuse trimming, which increases the cost and TAT in manufacturing and testing. Execution and simulation times are shortened down to 1/9 for less settling time in buffer and with improved logic. An automatic quick offset calibration circuit is implemented in a small silicon space in a high-speed hard disk drive (HDD) channel with 0.25-µm four-layer metal CMOS process. The measured data show this method works effectively in this system.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e82-a_2_301/_p
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@ARTICLE{e82-a_2_301,
author={Takeo YASUDA, Hajime ANDOH, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Differential Analog Data Path DC Offset Calibration Methods},
year={1999},
volume={E82-A},
number={2},
pages={301-306},
abstract={DC offset causes performance degradation in signal processing systems especially for high-speed applications. A new offset cancellation method that relaxes the requirement for the offset of the circuit components in the differential analog data path to about 10 times larger is introduced. This method moves the adjusting target from analog-to-digital converter (ADC) to its input buffer and adjusts DC level of ADC input to its center before the final offset cancellation. It eliminates post-production adjustment such as fuse trimming, which increases the cost and TAT in manufacturing and testing. Execution and simulation times are shortened down to 1/9 for less settling time in buffer and with improved logic. An automatic quick offset calibration circuit is implemented in a small silicon space in a high-speed hard disk drive (HDD) channel with 0.25-µm four-layer metal CMOS process. The measured data show this method works effectively in this system.},
keywords={},
doi={},
ISSN={},
month={February},}
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TY - JOUR
TI - Differential Analog Data Path DC Offset Calibration Methods
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 301
EP - 306
AU - Takeo YASUDA
AU - Hajime ANDOH
PY - 1999
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E82-A
IS - 2
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - February 1999
AB - DC offset causes performance degradation in signal processing systems especially for high-speed applications. A new offset cancellation method that relaxes the requirement for the offset of the circuit components in the differential analog data path to about 10 times larger is introduced. This method moves the adjusting target from analog-to-digital converter (ADC) to its input buffer and adjusts DC level of ADC input to its center before the final offset cancellation. It eliminates post-production adjustment such as fuse trimming, which increases the cost and TAT in manufacturing and testing. Execution and simulation times are shortened down to 1/9 for less settling time in buffer and with improved logic. An automatic quick offset calibration circuit is implemented in a small silicon space in a high-speed hard disk drive (HDD) channel with 0.25-µm four-layer metal CMOS process. The measured data show this method works effectively in this system.
ER -