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Finding All Solutions of Transistor Circuits Using the Dual Simplex Method

Kiyotaka YAMAMURA, Osamu NAKAMURA

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Summary :

An efficient algorithm is proposed for finding all solutions of piecewise-linear resistive circuits containing bipolar transistors. This algorithm is based on a powerful test (termed the LP test) for nonexistence of a solution in a given region using linear programming (LP). In the LP test, an LP problem is formulated by surrounding the exponential functions in the Ebers-Moll model by right-angled triangles, and it is solved by LP, for example, by the simplex method. In this paper, it is shown that the LP test can be performed by the dual simplex method, which makes the number of pivotings much smaller. Effectiveness of the proposed technique is confirmed by numerical examples.

Publication
IEICE TRANSACTIONS on Fundamentals Vol.E86-A No.2 pp.434-443
Publication Date
2003/02/01
Publicized
Online ISSN
DOI
Type of Manuscript
PAPER
Category
Nonlinear Problems

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