IEICE TRANSACTIONS on Fundamentals
Lead Open Detection Based on Supply Current of CMOS LSIs
Summary :
In this paper, a test method is proposed to detect lead opens in CMOS LSIs. The test method is based on supply current which flows when test input vectors and AC electric field are provided from the outside of the ICs. Also, an application method of the test input vectors is proposed in this paper. It is shown experimentally that lead opens of SSIs and LSIs will be detected by providing each of the test input vectors per the period of AC electric field applied.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E87-A No.6 pp.1330-1337
- Publication Date
- 2004/06/01
- Publicized
- Online ISSN
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- Type of Manuscript
- Special Section PAPER (Special Section on Papers Selected from 2003 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2003))
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Masao TAKAGI, Masaki HASHIZUME, Masahiro ICHIMIYA, Hiroyuki YOTSUYANAGI, Takeomi TAMESADA, "Lead Open Detection Based on Supply Current of CMOS LSIs" in IEICE TRANSACTIONS on Fundamentals,
vol. E87-A, no. 6, pp. 1330-1337, June 2004, doi: .
Abstract: In this paper, a test method is proposed to detect lead opens in CMOS LSIs. The test method is based on supply current which flows when test input vectors and AC electric field are provided from the outside of the ICs. Also, an application method of the test input vectors is proposed in this paper. It is shown experimentally that lead opens of SSIs and LSIs will be detected by providing each of the test input vectors per the period of AC electric field applied.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e87-a_6_1330/_p
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@ARTICLE{e87-a_6_1330,
author={Masao TAKAGI, Masaki HASHIZUME, Masahiro ICHIMIYA, Hiroyuki YOTSUYANAGI, Takeomi TAMESADA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Lead Open Detection Based on Supply Current of CMOS LSIs},
year={2004},
volume={E87-A},
number={6},
pages={1330-1337},
abstract={In this paper, a test method is proposed to detect lead opens in CMOS LSIs. The test method is based on supply current which flows when test input vectors and AC electric field are provided from the outside of the ICs. Also, an application method of the test input vectors is proposed in this paper. It is shown experimentally that lead opens of SSIs and LSIs will be detected by providing each of the test input vectors per the period of AC electric field applied.},
keywords={},
doi={},
ISSN={},
month={June},}
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TY - JOUR
TI - Lead Open Detection Based on Supply Current of CMOS LSIs
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1330
EP - 1337
AU - Masao TAKAGI
AU - Masaki HASHIZUME
AU - Masahiro ICHIMIYA
AU - Hiroyuki YOTSUYANAGI
AU - Takeomi TAMESADA
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E87-A
IS - 6
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - June 2004
AB - In this paper, a test method is proposed to detect lead opens in CMOS LSIs. The test method is based on supply current which flows when test input vectors and AC electric field are provided from the outside of the ICs. Also, an application method of the test input vectors is proposed in this paper. It is shown experimentally that lead opens of SSIs and LSIs will be detected by providing each of the test input vectors per the period of AC electric field applied.
ER -
English
