A Capacitance Measurement Device for Running Hardware Devices and Its Evaluations

Makoto NISHIZAWA; Kento HASEGAWA; Nozomu TOGAWA

doi:10.1587/transfun.2019KEP0005

A Capacitance Measurement Device for Running Hardware Devices and Its Evaluations

Makoto NISHIZAWA, Kento HASEGAWA, Nozomu TOGAWA

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In IoT (Internet-of-Things) era, the number and variety of hardware devices becomes continuously increasing. Several IoT devices are utilized at infrastructure equipments. How to maintain such IoT devices is a serious concern. Capacitance measurement is one of the powerful ways to detect anomalous states in the structure of the hardware devices. Particularly, measuring capacitance while the hardware device is running is a major challenge but no such researches proposed so far. This paper proposes a capacitance measuring device which measures device capacitance in operation. We firstly combine the AC (alternating current) voltage signal with the DC (direct current) supply voltage signal and generates the fluctuating signal. We supply the fluctuating signal to the target device instead of supplying the DC supply voltage. By effectively filtering the observed current in the target device, the filtered current can be proportional to the capacitance value and thus we can measure the target device capacitance even when it is running. We have implemented the proposed capacitance measuring device on the printed wiring board with the size of 95mm × 70mm and evaluated power consumption and accuracy of the capacitance measurement. The experimental results demonstrate that power consumption of the proposed capacitance measuring device is reduced by 65% in low-power mode from measuring mode and proposed device successfully measured capacitance in 0.002μF resolution.

Publication: IEICE TRANSACTIONS on Fundamentals Vol.E103-A No.9 pp.1018-1027

Publication Date: 2020/09/01

Publicized

Online ISSN: 1745-1337

DOI: 10.1587/transfun.2019KEP0005

Type of Manuscript: Special Section PAPER (Special Section on Circuits and Systems)

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Authors

Makoto NISHIZAWA
  Waseda University
Kento HASEGAWA
  Waseda University
Nozomu TOGAWA
  Waseda University

Keyword

hardware security, capacitance measurement, anomalous function detection, low power

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Makoto NISHIZAWA, Kento HASEGAWA, Nozomu TOGAWA, "A Capacitance Measurement Device for Running Hardware Devices and Its Evaluations" in IEICE TRANSACTIONS on Fundamentals, vol. E103-A, no. 9, pp. 1018-1027, September 2020, doi: 10.1587/transfun.2019KEP0005.
Abstract: In IoT (Internet-of-Things) era, the number and variety of hardware devices becomes continuously increasing. Several IoT devices are utilized at infrastructure equipments. How to maintain such IoT devices is a serious concern. Capacitance measurement is one of the powerful ways to detect anomalous states in the structure of the hardware devices. Particularly, measuring capacitance while the hardware device is running is a major challenge but no such researches proposed so far. This paper proposes a capacitance measuring device which measures device capacitance in operation. We firstly combine the AC (alternating current) voltage signal with the DC (direct current) supply voltage signal and generates the fluctuating signal. We supply the fluctuating signal to the target device instead of supplying the DC supply voltage. By effectively filtering the observed current in the target device, the filtered current can be proportional to the capacitance value and thus we can measure the target device capacitance even when it is running. We have implemented the proposed capacitance measuring device on the printed wiring board with the size of 95mm × 70mm and evaluated power consumption and accuracy of the capacitance measurement. The experimental results demonstrate that power consumption of the proposed capacitance measuring device is reduced by 65% in low-power mode from measuring mode and proposed device successfully measured capacitance in 0.002μF resolution.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.2019KEP0005/_p

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@ARTICLE{e103-a_9_1018,
author={Makoto NISHIZAWA, Kento HASEGAWA, Nozomu TOGAWA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A Capacitance Measurement Device for Running Hardware Devices and Its Evaluations},
year={2020},
volume={E103-A},
number={9},
pages={1018-1027},
abstract={In IoT (Internet-of-Things) era, the number and variety of hardware devices becomes continuously increasing. Several IoT devices are utilized at infrastructure equipments. How to maintain such IoT devices is a serious concern. Capacitance measurement is one of the powerful ways to detect anomalous states in the structure of the hardware devices. Particularly, measuring capacitance while the hardware device is running is a major challenge but no such researches proposed so far. This paper proposes a capacitance measuring device which measures device capacitance in operation. We firstly combine the AC (alternating current) voltage signal with the DC (direct current) supply voltage signal and generates the fluctuating signal. We supply the fluctuating signal to the target device instead of supplying the DC supply voltage. By effectively filtering the observed current in the target device, the filtered current can be proportional to the capacitance value and thus we can measure the target device capacitance even when it is running. We have implemented the proposed capacitance measuring device on the printed wiring board with the size of 95mm × 70mm and evaluated power consumption and accuracy of the capacitance measurement. The experimental results demonstrate that power consumption of the proposed capacitance measuring device is reduced by 65% in low-power mode from measuring mode and proposed device successfully measured capacitance in 0.002μF resolution.},
keywords={},
doi={10.1587/transfun.2019KEP0005},
ISSN={1745-1337},
month={September},}

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TY - JOUR
TI - A Capacitance Measurement Device for Running Hardware Devices and Its Evaluations
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1018
EP - 1027
AU - Makoto NISHIZAWA
AU - Kento HASEGAWA
AU - Nozomu TOGAWA
PY - 2020
DO - 10.1587/transfun.2019KEP0005
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E103-A
IS - 9
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - September 2020
AB - In IoT (Internet-of-Things) era, the number and variety of hardware devices becomes continuously increasing. Several IoT devices are utilized at infrastructure equipments. How to maintain such IoT devices is a serious concern. Capacitance measurement is one of the powerful ways to detect anomalous states in the structure of the hardware devices. Particularly, measuring capacitance while the hardware device is running is a major challenge but no such researches proposed so far. This paper proposes a capacitance measuring device which measures device capacitance in operation. We firstly combine the AC (alternating current) voltage signal with the DC (direct current) supply voltage signal and generates the fluctuating signal. We supply the fluctuating signal to the target device instead of supplying the DC supply voltage. By effectively filtering the observed current in the target device, the filtered current can be proportional to the capacitance value and thus we can measure the target device capacitance even when it is running. We have implemented the proposed capacitance measuring device on the printed wiring board with the size of 95mm × 70mm and evaluated power consumption and accuracy of the capacitance measurement. The experimental results demonstrate that power consumption of the proposed capacitance measuring device is reduced by 65% in low-power mode from measuring mode and proposed device successfully measured capacitance in 0.002μF resolution.
ER -