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Currently there has been increasing demand for real-time training on resource-limited IoT devices such as smart sensors, which realizes standalone online adaptation for streaming data without data transfers to remote servers. OS-ELM (Online Sequential Extreme Learning Machine) has been one of promising neural-network-based online algorithms for on-chip learning because it can perform online training at low computational cost and is easy to implement as a digital circuit. Existing OS-ELM digital circuits employ fixed-point data format and the bit-widths are often manually tuned, however, this may cause overflow or underflow which can lead to unexpected behavior of the circuit. For on-chip learning systems, an overflow/underflow-free design has a great impact since online training is continuously performed and the intervals of intermediate variables will dynamically change as time goes by. In this paper, we propose an overflow/underflow-free bit-width optimization method for fixed-point digital circuits of OS-ELM. Experimental results show that our method realizes overflow/underflow-free OS-ELM digital circuits with 1.0x - 1.5x more area cost compared to the baseline simulation method where overflow or underflow can happen.
Mineto TSUKADA
Keio University
Hiroki MATSUTANI
Keio University
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Mineto TSUKADA, Hiroki MATSUTANI, "An Overflow/Underflow-Free Fixed-Point Bit-Width Optimization Method for OS-ELM Digital Circuit" in IEICE TRANSACTIONS on Fundamentals,
vol. E105-A, no. 3, pp. 437-447, March 2022, doi: 10.1587/transfun.2021VLP0017.
Abstract: Currently there has been increasing demand for real-time training on resource-limited IoT devices such as smart sensors, which realizes standalone online adaptation for streaming data without data transfers to remote servers. OS-ELM (Online Sequential Extreme Learning Machine) has been one of promising neural-network-based online algorithms for on-chip learning because it can perform online training at low computational cost and is easy to implement as a digital circuit. Existing OS-ELM digital circuits employ fixed-point data format and the bit-widths are often manually tuned, however, this may cause overflow or underflow which can lead to unexpected behavior of the circuit. For on-chip learning systems, an overflow/underflow-free design has a great impact since online training is continuously performed and the intervals of intermediate variables will dynamically change as time goes by. In this paper, we propose an overflow/underflow-free bit-width optimization method for fixed-point digital circuits of OS-ELM. Experimental results show that our method realizes overflow/underflow-free OS-ELM digital circuits with 1.0x - 1.5x more area cost compared to the baseline simulation method where overflow or underflow can happen.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.2021VLP0017/_p
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@ARTICLE{e105-a_3_437,
author={Mineto TSUKADA, Hiroki MATSUTANI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={An Overflow/Underflow-Free Fixed-Point Bit-Width Optimization Method for OS-ELM Digital Circuit},
year={2022},
volume={E105-A},
number={3},
pages={437-447},
abstract={Currently there has been increasing demand for real-time training on resource-limited IoT devices such as smart sensors, which realizes standalone online adaptation for streaming data without data transfers to remote servers. OS-ELM (Online Sequential Extreme Learning Machine) has been one of promising neural-network-based online algorithms for on-chip learning because it can perform online training at low computational cost and is easy to implement as a digital circuit. Existing OS-ELM digital circuits employ fixed-point data format and the bit-widths are often manually tuned, however, this may cause overflow or underflow which can lead to unexpected behavior of the circuit. For on-chip learning systems, an overflow/underflow-free design has a great impact since online training is continuously performed and the intervals of intermediate variables will dynamically change as time goes by. In this paper, we propose an overflow/underflow-free bit-width optimization method for fixed-point digital circuits of OS-ELM. Experimental results show that our method realizes overflow/underflow-free OS-ELM digital circuits with 1.0x - 1.5x more area cost compared to the baseline simulation method where overflow or underflow can happen.},
keywords={},
doi={10.1587/transfun.2021VLP0017},
ISSN={1745-1337},
month={March},}
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TY - JOUR
TI - An Overflow/Underflow-Free Fixed-Point Bit-Width Optimization Method for OS-ELM Digital Circuit
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 437
EP - 447
AU - Mineto TSUKADA
AU - Hiroki MATSUTANI
PY - 2022
DO - 10.1587/transfun.2021VLP0017
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E105-A
IS - 3
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - March 2022
AB - Currently there has been increasing demand for real-time training on resource-limited IoT devices such as smart sensors, which realizes standalone online adaptation for streaming data without data transfers to remote servers. OS-ELM (Online Sequential Extreme Learning Machine) has been one of promising neural-network-based online algorithms for on-chip learning because it can perform online training at low computational cost and is easy to implement as a digital circuit. Existing OS-ELM digital circuits employ fixed-point data format and the bit-widths are often manually tuned, however, this may cause overflow or underflow which can lead to unexpected behavior of the circuit. For on-chip learning systems, an overflow/underflow-free design has a great impact since online training is continuously performed and the intervals of intermediate variables will dynamically change as time goes by. In this paper, we propose an overflow/underflow-free bit-width optimization method for fixed-point digital circuits of OS-ELM. Experimental results show that our method realizes overflow/underflow-free OS-ELM digital circuits with 1.0x - 1.5x more area cost compared to the baseline simulation method where overflow or underflow can happen.
ER -