IEICE TRANSACTIONS on Fundamentals
Sleep Transistor Sizing Method Using Accurate Delay Estimation Considering Input Vector Pattern and Non-linear Current Model
Summary :
Beyond deep sub-micron era, Power Gating (PG) is one of the most effective techniques to reduce leakage power of circuits. The most important issue of PG circuit design is how to decide the width of sleep transistor. Smaller total sleep transistor width provides smaller leakage power in standby mode, however, insufficient sleep transistor insertion suffers from significant performance degradation. In this paper, we present an accurate and fast gate-level delay estimation method for PG circuits and a novel sleep transistor sizing method utilizing our delay estimation for module-based PG circuits. This method achieves high accuracy within acceptable computation time utilizing accurate discharge current estimation based on delayed logic simulations with limited input vector patterns and by realizing precise current characteristics for logic gates and sleep transistors. Experimental results show that our delay estimation successfully achieves high accuracy and avoids overestimation and underestimation seen in conventional method. Also, our sleep transistor sizing method on average successfully reduces the width of sleep transistors by 40% when compared to conventional methods within an acceptable computation time.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E94-A No.12 pp.2499-2509
- Publication Date
- 2011/12/01
- Publicized
- Online ISSN
- 1745-1337
- DOI
- 10.1587/transfun.E94.A.2499
- Type of Manuscript
- Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
- Category
- Physical Level Design
Authors
Keyword
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Seidai TAKEDA, Kyundong KIM, Hiroshi NAKAMURA, Kimiyoshi USAMI, "Sleep Transistor Sizing Method Using Accurate Delay Estimation Considering Input Vector Pattern and Non-linear Current Model" in IEICE TRANSACTIONS on Fundamentals,
vol. E94-A, no. 12, pp. 2499-2509, December 2011, doi: 10.1587/transfun.E94.A.2499.
Abstract: Beyond deep sub-micron era, Power Gating (PG) is one of the most effective techniques to reduce leakage power of circuits. The most important issue of PG circuit design is how to decide the width of sleep transistor. Smaller total sleep transistor width provides smaller leakage power in standby mode, however, insufficient sleep transistor insertion suffers from significant performance degradation. In this paper, we present an accurate and fast gate-level delay estimation method for PG circuits and a novel sleep transistor sizing method utilizing our delay estimation for module-based PG circuits. This method achieves high accuracy within acceptable computation time utilizing accurate discharge current estimation based on delayed logic simulations with limited input vector patterns and by realizing precise current characteristics for logic gates and sleep transistors. Experimental results show that our delay estimation successfully achieves high accuracy and avoids overestimation and underestimation seen in conventional method. Also, our sleep transistor sizing method on average successfully reduces the width of sleep transistors by 40% when compared to conventional methods within an acceptable computation time.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E94.A.2499/_p
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@ARTICLE{e94-a_12_2499,
author={Seidai TAKEDA, Kyundong KIM, Hiroshi NAKAMURA, Kimiyoshi USAMI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Sleep Transistor Sizing Method Using Accurate Delay Estimation Considering Input Vector Pattern and Non-linear Current Model},
year={2011},
volume={E94-A},
number={12},
pages={2499-2509},
abstract={Beyond deep sub-micron era, Power Gating (PG) is one of the most effective techniques to reduce leakage power of circuits. The most important issue of PG circuit design is how to decide the width of sleep transistor. Smaller total sleep transistor width provides smaller leakage power in standby mode, however, insufficient sleep transistor insertion suffers from significant performance degradation. In this paper, we present an accurate and fast gate-level delay estimation method for PG circuits and a novel sleep transistor sizing method utilizing our delay estimation for module-based PG circuits. This method achieves high accuracy within acceptable computation time utilizing accurate discharge current estimation based on delayed logic simulations with limited input vector patterns and by realizing precise current characteristics for logic gates and sleep transistors. Experimental results show that our delay estimation successfully achieves high accuracy and avoids overestimation and underestimation seen in conventional method. Also, our sleep transistor sizing method on average successfully reduces the width of sleep transistors by 40% when compared to conventional methods within an acceptable computation time.},
keywords={},
doi={10.1587/transfun.E94.A.2499},
ISSN={1745-1337},
month={December},}
Copy
TY - JOUR
TI - Sleep Transistor Sizing Method Using Accurate Delay Estimation Considering Input Vector Pattern and Non-linear Current Model
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2499
EP - 2509
AU - Seidai TAKEDA
AU - Kyundong KIM
AU - Hiroshi NAKAMURA
AU - Kimiyoshi USAMI
PY - 2011
DO - 10.1587/transfun.E94.A.2499
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E94-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2011
AB - Beyond deep sub-micron era, Power Gating (PG) is one of the most effective techniques to reduce leakage power of circuits. The most important issue of PG circuit design is how to decide the width of sleep transistor. Smaller total sleep transistor width provides smaller leakage power in standby mode, however, insufficient sleep transistor insertion suffers from significant performance degradation. In this paper, we present an accurate and fast gate-level delay estimation method for PG circuits and a novel sleep transistor sizing method utilizing our delay estimation for module-based PG circuits. This method achieves high accuracy within acceptable computation time utilizing accurate discharge current estimation based on delayed logic simulations with limited input vector patterns and by realizing precise current characteristics for logic gates and sleep transistors. Experimental results show that our delay estimation successfully achieves high accuracy and avoids overestimation and underestimation seen in conventional method. Also, our sleep transistor sizing method on average successfully reduces the width of sleep transistors by 40% when compared to conventional methods within an acceptable computation time.
ER -
English
