IEICE TRANSACTIONS on Fundamentals
Hybrid Test Application in Partial Skewed-Load Scan Design
Summary :
In this paper, we propose a hybrid test application in partial skewed-load (PSL) scan design. The PSL scan design in which some flip-flops (FFs) are controlled as skewed-load FFs and the others are controlled as broad-side FFs was proposed in [1]. We notice that the PSL scan design potentially has a capability of two test application modes: one is the broad-side test mode, and the other is the hybrid test mode which corresponds to the test application considered in [1]. According to this observation, we present a hybrid test application of the two test modes in the PSL scan design. In addition, we also address a way of skewed-load FF selection based on propagation dominance of FFs in order to take advantage of the hybrid test application. Experimental results for ITC'99 benchmark circuits show that the hybrid test application in the proposed PSL scan design can achieve higher fault coverage than the design based on the skewed-load FF selection [1] does.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E94-A No.12 pp.2571-2578
- Publication Date
- 2011/12/01
- Publicized
- Online ISSN
- 1745-1337
- DOI
- 10.1587/transfun.E94.A.2571
- Type of Manuscript
- Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
- Category
- Logic Synthesis, Test and Verification
Authors
Keyword
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Yuki YOSHIKAWA, Tomomi NUWA, Hideyuki ICHIHARA, Tomoo INOUE, "Hybrid Test Application in Partial Skewed-Load Scan Design" in IEICE TRANSACTIONS on Fundamentals,
vol. E94-A, no. 12, pp. 2571-2578, December 2011, doi: 10.1587/transfun.E94.A.2571.
Abstract: In this paper, we propose a hybrid test application in partial skewed-load (PSL) scan design. The PSL scan design in which some flip-flops (FFs) are controlled as skewed-load FFs and the others are controlled as broad-side FFs was proposed in [1]. We notice that the PSL scan design potentially has a capability of two test application modes: one is the broad-side test mode, and the other is the hybrid test mode which corresponds to the test application considered in [1]. According to this observation, we present a hybrid test application of the two test modes in the PSL scan design. In addition, we also address a way of skewed-load FF selection based on propagation dominance of FFs in order to take advantage of the hybrid test application. Experimental results for ITC'99 benchmark circuits show that the hybrid test application in the proposed PSL scan design can achieve higher fault coverage than the design based on the skewed-load FF selection [1] does.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E94.A.2571/_p
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@ARTICLE{e94-a_12_2571,
author={Yuki YOSHIKAWA, Tomomi NUWA, Hideyuki ICHIHARA, Tomoo INOUE, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Hybrid Test Application in Partial Skewed-Load Scan Design},
year={2011},
volume={E94-A},
number={12},
pages={2571-2578},
abstract={In this paper, we propose a hybrid test application in partial skewed-load (PSL) scan design. The PSL scan design in which some flip-flops (FFs) are controlled as skewed-load FFs and the others are controlled as broad-side FFs was proposed in [1]. We notice that the PSL scan design potentially has a capability of two test application modes: one is the broad-side test mode, and the other is the hybrid test mode which corresponds to the test application considered in [1]. According to this observation, we present a hybrid test application of the two test modes in the PSL scan design. In addition, we also address a way of skewed-load FF selection based on propagation dominance of FFs in order to take advantage of the hybrid test application. Experimental results for ITC'99 benchmark circuits show that the hybrid test application in the proposed PSL scan design can achieve higher fault coverage than the design based on the skewed-load FF selection [1] does.},
keywords={},
doi={10.1587/transfun.E94.A.2571},
ISSN={1745-1337},
month={December},}
Copy
TY - JOUR
TI - Hybrid Test Application in Partial Skewed-Load Scan Design
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2571
EP - 2578
AU - Yuki YOSHIKAWA
AU - Tomomi NUWA
AU - Hideyuki ICHIHARA
AU - Tomoo INOUE
PY - 2011
DO - 10.1587/transfun.E94.A.2571
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E94-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2011
AB - In this paper, we propose a hybrid test application in partial skewed-load (PSL) scan design. The PSL scan design in which some flip-flops (FFs) are controlled as skewed-load FFs and the others are controlled as broad-side FFs was proposed in [1]. We notice that the PSL scan design potentially has a capability of two test application modes: one is the broad-side test mode, and the other is the hybrid test mode which corresponds to the test application considered in [1]. According to this observation, we present a hybrid test application of the two test modes in the PSL scan design. In addition, we also address a way of skewed-load FF selection based on propagation dominance of FFs in order to take advantage of the hybrid test application. Experimental results for ITC'99 benchmark circuits show that the hybrid test application in the proposed PSL scan design can achieve higher fault coverage than the design based on the skewed-load FF selection [1] does.
ER -
English
